Journal of Applied Physics

Journal of Applied Physics

ISSNs: 0021-8979

Additional searchable ISSN (electronic): 1089-7550

AMER INST PHYSICS, United States

Scopus rating (2023): CiteScore 5.4 SJR 0.649 SNIP 0.96

Journal

Journal Metrics

Research Output

  1. 1987
  2. Correlation between solid-state reaction and electrical properties of the Rh/GaAs Schottky contact

    Yu, K. M., Cheung, S. K., Sands, T., Jaklevic, J. M. & Haller, E. E., 1987, In: Journal of Applied Physics. 61, 3, p. 1099-1102

    Research output: Journal Publications and ReviewsRGC 21 - Publication in refereed journalpeer-review

    Scopus citations: 14
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  3. Electrical characterization of Schottky contacts of Au, Al, Gd, and Pt on n-type and p-type GaAs

    Okumura, T. & Tu, K. N., 1987, In: Journal of Applied Physics. 61, 8, p. 2955-2961

    Research output: Journal Publications and ReviewsRGC 21 - Publication in refereed journalpeer-review

    Scopus citations: 39
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  4. Electrical transport properties of transition-metal disilicide films

    Nava, F., Tu, K. N., Mazzega, E., Michelini, M. & Queirolo, G., 1987, In: Journal of Applied Physics. 61, 3, p. 1085-1093

    Research output: Journal Publications and ReviewsRGC 21 - Publication in refereed journalpeer-review

    Scopus citations: 69
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  5. Enhanced grain growth of polycrystalline silicon at low temperature by dopant redistribution

    Chou, T. C., Wong, C. Y. & Tu, K. N., 1987, In: Journal of Applied Physics. 62, 7, p. 2722-2726

    Research output: Journal Publications and ReviewsRGC 21 - Publication in refereed journalpeer-review

    Scopus citations: 4
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  6. In situ resistivity measurement of cobalt silicide formation

    Ottaviani, G., Tu, K. N., Psaras, P. & Nobili, C., 1987, In: Journal of Applied Physics. 62, 6, p. 2290-2294

    Research output: Journal Publications and ReviewsRGC 21 - Publication in refereed journalpeer-review

    Scopus citations: 29
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  7. Interfacial interactions of evaporated iridium thin films with (100) GaAs

    Yu, K. M., Sands, T., Jaklevic, J. M. & Haller, E. E., 1987, In: Journal of Applied Physics. 62, 5, p. 1815-1820

    Research output: Journal Publications and ReviewsRGC 21 - Publication in refereed journalpeer-review

    Scopus citations: 10
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  8. Lattice imaging of metastable TiSi2

    Chou, T. C., Wong, C. Y. & Tu, K. N., 1987, In: Journal of Applied Physics. 62, 6, p. 2275-2279

    Research output: Journal Publications and ReviewsRGC 21 - Publication in refereed journalpeer-review

    Scopus citations: 59
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  9. Localized epitaxial growth of ReSi2 on (111) and (001) silicon

    Chu, J. J., Chen, L. J. & Tu, K. N., 1987, In: Journal of Applied Physics. 62, 2, p. 461-465

    Research output: Journal Publications and ReviewsRGC 21 - Publication in refereed journalpeer-review

    Scopus citations: 24
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  10. Silicided shallow junction formation by ion implantation of impurity ions into silicide layers and subsequent drive-in

    Kwong, D. L., Ku, Y. H., Lee, S. K., Louis, E., Alvi, N. S. & Chu, P., 1987, In: Journal of Applied Physics. 61, 11, p. 5084-5088

    Research output: Journal Publications and ReviewsRGC 21 - Publication in refereed journalpeer-review

    Scopus citations: 55
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  11. 1986
  12. Morphology and kinetics of crystallization of amorphous V75Si25 thin-alloy films

    Nava, F., Weiss, B. Z., Tu, K. N., Smith, D. A. & Psaras, P. A., 1 Oct 1986, In: Journal of Applied Physics. 60, 7, p. 2445-2452

    Research output: Journal Publications and ReviewsRGC 21 - Publication in refereed journalpeer-review

    Scopus citations: 16
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  13. Surface segregation during deposition

    Eykholt, R. & Srolovitz, D. J., 1 Sept 1986, In: Journal of Applied Physics. 60, 5, p. 1793-1796

    Research output: Journal Publications and ReviewsRGC 21 - Publication in refereed journalpeer-review

    Scopus citations: 5
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  14. Capillary instabilities in thin films. I. Energetics

    Srolovitz, D. J. & Safran, S. A., 1 Jul 1986, In: Journal of Applied Physics. 60, 1, p. 247-254

    Research output: Journal Publications and ReviewsRGC 21 - Publication in refereed journalpeer-review

    Scopus citations: 282
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  15. Capillary instabilities in thin films. II. Kinetics

    Srolovitz, D. J. & Safran, S. A., 1 Jul 1986, In: Journal of Applied Physics. 60, 1, p. 255-260

    Research output: Journal Publications and ReviewsRGC 21 - Publication in refereed journalpeer-review

    Scopus citations: 228
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  16. Atom and acceptor depth distributions for aluminum channeled in silicon as a function of ion energy and crystal orientation

    Wilson, R. G., Jamba, D. M., Chu, P. K., Hopkins, C. G. & Hitzman, C. J., 1986, In: Journal of Applied Physics. 60, 8, p. 2806-2809

    Research output: Journal Publications and ReviewsRGC 21 - Publication in refereed journalpeer-review

    Scopus citations: 6
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  17. Effect of temperature on electrical and microstructural changes of coevaporated Ir-Si alloy films

    Weiss, B. Z., Tu, K. N. & Smith, D. A., 1986, In: Journal of Applied Physics. 59, 2, p. 415-423

    Research output: Journal Publications and ReviewsRGC 21 - Publication in refereed journalpeer-review

    Scopus citations: 19
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  18. Phase transformations in alloy and bilayer thin films of vanadium and silicon

    Nava, F., Psaras, P. A., Takai, H. & Tu, K. N., 1986, In: Journal of Applied Physics. 59, 7, p. 2429-2438

    Research output: Journal Publications and ReviewsRGC 21 - Publication in refereed journalpeer-review

    Scopus citations: 18
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  19. Schottky barrier degradation of the W/GaAs system after high-temperature annealing

    Yu, K. M., Cheung, S. K., Sands, T., Jaklevic, J. M., Cheung, N. W. & Haller, E. E., 1986, In: Journal of Applied Physics. 60, 9, p. 3235-3242

    Research output: Journal Publications and ReviewsRGC 21 - Publication in refereed journalpeer-review

    Scopus citations: 41
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  20. Stability of oxides grown on tantalum silicide surfaces

    Cros, A. & Tu, K. N., 1986, In: Journal of Applied Physics. 60, 9, p. 3323-3326

    Research output: Journal Publications and ReviewsRGC 21 - Publication in refereed journalpeer-review

    Scopus citations: 25
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  21. Titanium-tungsten contacts to silicon. II. Stability against aluminum penetration

    Babcock, S. E. & Tu, K. N., 1986, In: Journal of Applied Physics. 59, 5, p. 1599-1605

    Research output: Journal Publications and ReviewsRGC 21 - Publication in refereed journalpeer-review

    Scopus citations: 18
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  22. 1985
  23. Effects of substrate crystallinity and dopant on the growth kinetics of platinum silicides

    Takai, H., Psaras, P. A. & Tu, K. N., 1985, In: Journal of Applied Physics. 58, 11, p. 4165-4171

    Research output: Journal Publications and ReviewsRGC 21 - Publication in refereed journalpeer-review

    Scopus citations: 21
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