Journal of Applied Physics

Journal of Applied Physics

ISSNs: 0021-8979

Additional searchable ISSN (Electronic): 1089-7550

AMER INST PHYSICS, United States

Scopus rating (2022): CiteScore 5.1 SJR 0.706 SNIP 1.006

Journal

Journal Metrics
441 - 460 out of 616Page size: 20

Research Output

  1. 1999

  2. Thermoelectric characterization of Si thin films in silicon-on-insulator wafers

    Liao, C. N., Chen, C. & Tu, K. N., Sept 1999, In: Journal of Applied Physics. 86, 6, p. 3204-3208

    Research output: Journal Publications and Reviews (RGC: 21, 22, 62) › 21_Publication in refereed journal › peer-review

    Scopus citations: 17
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  3. Published

    Particle-in-cell and Monte Carlo simulation of the hydrogen plasma immersion ion implantation process

    Kwok, D. T., Chu, P. K., Wood, B. P. & Chan, C., 15 Aug 1999, In: Journal of Applied Physics. 86, 4, p. 1817-1821

    Research output: Journal Publications and Reviews (RGC: 21, 22, 62) › 21_Publication in refereed journal › peer-review

    Scopus citations: 20
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  4. Dopant activation of heavily doped silicon-on-insulator by high density currents

    Chen, C., Huang, J. S., Liao, C. N. & Tu, K. N., Aug 1999, In: Journal of Applied Physics. 86, 3, p. 1552-1557

    Research output: Journal Publications and Reviews (RGC: 21, 22, 62) › 21_Publication in refereed journal › peer-review

    Scopus citations: 1
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  5. Kinetic analysis of interfacial diffusion accompanied by intermetallic compound formation

    Kim, P. G., Jang, J. W., Tu, K. N. & Frear, D. R., Aug 1999, In: Journal of Applied Physics. 86, 3, p. 1266-1272

    Research output: Journal Publications and Reviews (RGC: 21, 22, 62) › 21_Publication in refereed journal › peer-review

    Scopus citations: 2
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  6. Published

    Investigation of dose uniformity on the inner races of bearings treated by plasma immersion ion implantation

    Zeng, Z. M., Kwok, T. K., Tian, X. B., Tang, B. Y. & Chu, P. K., Jul 1999, In: Journal of Applied Physics. 86, 1, p. 120-123

    Research output: Journal Publications and Reviews (RGC: 21, 22, 62) › 21_Publication in refereed journal › peer-review

    Scopus citations: 35
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  7. Dependence of the fundamental band gap of AlXGa1-XN on alloy composition and pressure

    Shan, W., Ager III, J. W., Yu, K. M., Walukiewicz, W., Haller, E. E., Martin, M. C., McKinney, W. R., & 1 othersYang, W., 15 Jun 1999, In: Journal of Applied Physics. 85, 12, p. 8505-8507

    Research output: Journal Publications and Reviews (RGC: 21, 22, 62) › 21_Publication in refereed journal › peer-review

    Scopus citations: 110
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  8. Solder reaction-assisted crystallization of electroless Ni-P under bump metallization in low cost flip chip technology

    Jang, J. W., Kim, P. G., Tu, K. N., Frear, D. R. & Thompson, P., 15 Jun 1999, In: Journal of Applied Physics. 85, 12, p. 8456-8463

    Research output: Journal Publications and Reviews (RGC: 21, 22, 62) › 21_Publication in refereed journal › peer-review

    Scopus citations: 25
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  9. Published

    Morphology of Si nanowires synthesized by high-temperature laser ablation

    Tang, Y. H., Zhang, Y. F., Wang, N., Lee, C. S., Han, X. D., Bello, I. & Lee, S. T., Jun 1999, In: Journal of Applied Physics. 85, 11, p. 7981-7983

    Research output: Journal Publications and Reviews (RGC: 21, 22, 62) › 21_Publication in refereed journal › peer-review

    Scopus citations: 101
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  10. Published

    Computed electron oscillation inside the duct of a vacuum arc source

    Kwok, T. K., Zhang, T., Chu, P. K., Bilek, M. M. M. & Brown, I. G., 1 May 1999, In: Journal of Applied Physics. 85, 9, p. 6381-6384

    Research output: Journal Publications and Reviews (RGC: 21, 22, 62) › 21_Publication in refereed journal › peer-review

    Scopus citations: 8
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  11. Direct correlation between mechanical failure and metallurgical reaction in flip chip solder joints

    Liu, C. Y., Chen, C., Mal, A. K. & Tu, K. N., 1 Apr 1999, In: Journal of Applied Physics. 85, 7, p. 3882-3886

    Research output: Journal Publications and Reviews (RGC: 21, 22, 62) › 21_Publication in refereed journal › peer-review

    Scopus citations: 7
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  12. Chain/column evolution and corresponding electrorheological effect

    Wen, W., Zheng, D. W. & Tu, K. N., 1999, In: Journal of Applied Physics. 85, 1, p. 530-533

    Research output: Journal Publications and Reviews (RGC: 21, 22, 62) › 21_Publication in refereed journal › peer-review

    Scopus citations: 4
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  13. 1998

  14. Abnormal electrical behavior and phase changes in implanted p+- And n+-Si channels under high current densities

    Huang, J. S., Liao, C. N., Tu, K. N., Cheng, S. L. & Chen, L. J., 1 Nov 1998, In: Journal of Applied Physics. 84, 9, p. 4788-4796

    Research output: Journal Publications and Reviews (RGC: 21, 22, 62) › 21_Publication in refereed journal › peer-review

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  15. Published

    Carbon and group II acceptor coimplantation in GaAs

    Morton, R., Lau, S. S., Poker, D. B., Chu, P. K., Fung, K. K. & Wang, N., 1 Nov 1998, In: Journal of Applied Physics. 84, 9, p. 4929-4934

    Research output: Journal Publications and Reviews (RGC: 21, 22, 62) › 21_Publication in refereed journal › peer-review

    Scopus citations: 6
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  16. Texture development mechanisms in ion beam assisted deposition

    Dong, L. & Srolovitz, D. J., 1 Nov 1998, In: Journal of Applied Physics. 84, 9, p. 5261-5269

    Research output: Journal Publications and Reviews (RGC: 21, 22, 62) › 21_Publication in refereed journal › peer-review

    Scopus citations: 22
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  17. Published

    Dose and energy uniformity over inner surface in plasma immersion ion implantation

    Liu, A. G., Wang, X. F., Tang, B. Y. & Chu, P. K., 15 Aug 1998, In: Journal of Applied Physics. 84, 4, p. 1859-1862

    Research output: Journal Publications and Reviews (RGC: 21, 22, 62) › 21_Publication in refereed journal › peer-review

    Scopus citations: 15
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  18. Time- and temperature-dependent wetting behavior of eutectic SnPb on Cu leadframes plated with Pd/Ni and Au/Pd/Ni thin films

    Kim, P. G., Tu, K. N. & Abbott, D. C., 15 Jul 1998, In: Journal of Applied Physics. 84, 2, p. 770-775

    Research output: Journal Publications and Reviews (RGC: 21, 22, 62) › 21_Publication in refereed journal › peer-review

    Scopus citations: 13
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  19. Characterization of the local structure of amorphous GaAs produced by ion implantation

    Ridgway, M. C., Glover, C. J., Foran, G. J. & Yu, K. M., 1 May 1998, In: Journal of Applied Physics. 83, 9, p. 4610-4614

    Research output: Journal Publications and Reviews (RGC: 21, 22, 62) › 21_Publication in refereed journal › peer-review

    Scopus citations: 43
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  20. Published

    Effects of bandwidth limitations on the localized state distribution calculated from transient photoconductivity data

    Webb, D. P., Main, C., Reynolds, S., Chan, Y. C., Lam, Y. W. & O'Leary, S. K., 1 May 1998, In: Journal of Applied Physics. 83, 9, p. 4782-4787

    Research output: Journal Publications and Reviews (RGC: 21, 22, 62) › 21_Publication in refereed journal › peer-review

    Scopus citations: 7
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  21. Published

    Oriented diamond growth on silicon (111) using a solid carbon source

    Woo, H. K., Lee, C. S., Bello, I., Lee, S. T., Wong, K. W. & Wong, N. B., 15 Apr 1998, In: Journal of Applied Physics. 83, 8, p. 4187-4192

    Research output: Journal Publications and Reviews (RGC: 21, 22, 62) › 21_Publication in refereed journal › peer-review

    Scopus citations: 10
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  22. Published

    Plasma immersion ion implantation of the interior surface of a large cylindrical bore using an auxiliary electrode

    Zeng, X. C., Kwok, T. K., Liu, A. G., Chu, P. K. & Tang, B. Y., 1 Jan 1998, In: Journal of Applied Physics. 83, 1, p. 44-49

    Research output: Journal Publications and Reviews (RGC: 21, 22, 62) › 21_Publication in refereed journal › peer-review

    Scopus citations: 34
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