IEEE Transactions on Reliability

IEEE Transactions on Reliability

ISSNs: 0018-9529, 0097-4552, 2168-2771, 2168-2755

Additional searchable ISSN (electronic): 1558-1721, 2168-2801, 2168-2798, 2168-2763

Institute of Electrical and Electronics Engineers, United States

Scopus rating (2023): CiteScore 12.2 SJR 1.511 SNIP 1.989

Journal

Journal Metrics
61 - 80 out of 112Page size: 20

Research Output

  1. 2009
  2. Published

    Modeling of IC socket contact resistance for reliability and health monitoring applications

    Lopez, L. D. & Pecht, M. G., 2009, In: IEEE Transactions on Reliability. 58, 2, p. 264-270

    Research output: Journal Publications and Reviews › RGC 22 - Publication in policy or professional journal

    Scopus citations: 4
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  3. 2008
  4. Published

    Reliability bounds for multi-state k-out-of-n systems

    Tian, Z., Yam, R. C. M., Zuo, M. J. & Huang, H.-Z., Mar 2008, In: IEEE Transactions on Reliability. 57, 1, p. 53-58

    Research output: Journal Publications and Reviews › RGC 21 - Publication in refereed journal › peer-review

    Scopus citations: 34
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  5. Published

    Comments on "A hierarchy of importance indices"

    Zhu, X. & Kuo, W., 2008, In: IEEE Transactions on Reliability. 57, 3, p. 529-531

    Research output: Journal Publications and Reviews › Comment/debate

    Scopus citations: 7
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  6. 2007

  7. Compatibility and simplicity: The fundamentals of reliability

    Kuo, W., Dec 2007, In: IEEE Transactions on Reliability. 56, 4, p. 585-586

    Research output: Journal Publications and Reviews › Editorial Preface

    Scopus citations: 2
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  8. Modeling and analysis of software fault detection and correction process by considering time dependency

    Wu, Y. P., Hu, Q. P., Xie, M. & Ng, S. H., Dec 2007, In: IEEE Transactions on Reliability. 56, 4, p. 629-642

    Research output: Journal Publications and Reviews › RGC 21 - Publication in refereed journal › peer-review

    Scopus citations: 97
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  9. Classifying weak, and strong components using ROC analysis with application to burn-in

    Wu, S. & Xie, M., Sept 2007, In: IEEE Transactions on Reliability. 56, 3, p. 552-561

    Research output: Journal Publications and Reviews › RGC 21 - Publication in refereed journal › peer-review

    Scopus citations: 20
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  10. Reliability for sparsely connected consecutive-k systems

    Zhao, X., Cui, L. & Kuo, W., Sept 2007, In: IEEE Transactions on Reliability. 56, 3, p. 516-524

    Research output: Journal Publications and Reviews › RGC 21 - Publication in refereed journal › peer-review

    Scopus citations: 45
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  11. Published

    R-Impact: Reliability-based citation impact factor

    Kuo, W. & Rupe, J., Sept 2007, In: IEEE Transactions on Reliability. 56, 3, p. 366-367

    Research output: Journal Publications and Reviews › Editorial Preface

    Scopus citations: 16
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  12. Statistical models for hot electron degradation in nano-scaled MOSFET devices

    Bae, S. B., Kim, S.-J., Kuo, W. & Kvam, P. H., Sept 2007, In: IEEE Transactions on Reliability. 56, 3, p. 392-400

    Research output: Journal Publications and Reviews › RGC 21 - Publication in refereed journal › peer-review

    Scopus citations: 25
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  13. Editorial: How reliable is teaching evaluation? The relationship of class size to teaching evaluation scores

    Kuo, W., Jun 2007, In: IEEE Transactions on Reliability. 56, 2, p. 178-181

    Research output: Journal Publications and Reviews › Editorial Preface

    Scopus citations: 7
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  14. Corrections to “Challenges Related to Reliability in Nano Electronics” (IEEE Transactions on Reliability vol. 1 (569))

    Kuo, W., Mar 2007, In: IEEE Transactions on Reliability. 56, 1, p. 169

    Research output: Journal Publications and Reviews › Erratum

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  15. 2006

  16. Challenges Related to Reliability in Nano Electronics

    KUO, W., Dec 2006, In: IEEE Transactions on Reliability. 55, 4, p. 569-570

    Research output: Journal Publications and Reviews › Editorial Preface

    Scopus citations: 31
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  17. Assessment for U.S. engineering programs

    Kuo, W., Mar 2006, In: IEEE Transactions on Reliability. 55, 1, p. 1-6

    Research output: Journal Publications and Reviews › RGC 21 - Publication in refereed journal › peer-review

    Scopus citations: 5
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  18. Multi-path heuristic for redundancy allocation: The tree heuristic

    Ha, C. & Kuo, W., Mar 2006, In: IEEE Transactions on Reliability. 55, 1, p. 37-43

    Research output: Journal Publications and Reviews › RGC 21 - Publication in refereed journal › peer-review

    Scopus citations: 16
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  19. 2005

  20. Some considerations on system burn-in

    Kim, K. O. & Kuo, W., Jun 2005, In: IEEE Transactions on Reliability. 54, 2, p. 207-214

    Research output: Journal Publications and Reviews › RGC 21 - Publication in refereed journal › peer-review

    Scopus citations: 18
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  21. Modeling and analysis of correlated software failures of multiple types

    Dai, Y.-S., Xie, M. & Poh, K.-L., Mar 2005, In: IEEE Transactions on Reliability. 54, 1, p. 100-106

    Research output: Journal Publications and Reviews › RGC 21 - Publication in refereed journal › peer-review

    Scopus citations: 81
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  22. 2004

  23. Specifying interdependence in networked systems

    Singpurwalla, N. D. & Kong, C.-W., Sept 2004, In: IEEE Transactions on Reliability. 53, 3, p. 401-405

    Research output: Journal Publications and Reviews › RGC 21 - Publication in refereed journal › peer-review

    Scopus citations: 17
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  24. Optimal allocation of minimal and perfect repairs under resource constraints

    Cui, L., Kuo, W., Loh, H. T. & Xie, M., Jun 2004, In: IEEE Transactions on Reliability. 53, 2, p. 193-199

    Research output: Journal Publications and Reviews › RGC 21 - Publication in refereed journal › peer-review

    Scopus citations: 61
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  25. 2003
  26. Published

    IEEE Transactions on Reliability: Editor's Note

    Kuo, W., Dec 2003, In: IEEE Transactions on Reliability. 52, 4

    Research output: Journal Publications and Reviews › Editorial Preface

    Scopus citations: 1
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  27. A modified Weibull distribution

    Lai, C. D., Xie, M. & Murthy, D. N. P., Mar 2003, In: IEEE Transactions on Reliability. 52, 1, p. 33-37

    Research output: Journal Publications and Reviews › RGC 21 - Publication in refereed journal › peer-review

    Scopus citations: 453
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