IEEE Transactions on Reliability

IEEE Transactions on Reliability

ISSNs: 0018-9529, 0097-4552, 2168-2771, 2168-2755

Additional searchable ISSN (Electronic): 1558-1721, 2168-2801, 2168-2798, 2168-2763

Institute of Electrical and Electronics Engineers, United States

Scopus rating (2022): CiteScore 10.1 SJR 1.296 SNIP 2.072

Journal

Journal Metrics

Research Output

  1. 2008
  2. Published

    Comments on "A hierarchy of importance indices"

    Zhu, X. & Kuo, W., 2008, In: IEEE Transactions on Reliability. 57, 3, p. 529-531

    Research output: Journal Publications and ReviewsComment/debate

    Scopus citations: 7
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  3. 2007
  4. Compatibility and simplicity: The fundamentals of reliability

    Kuo, W., Dec 2007, In: IEEE Transactions on Reliability. 56, 4, p. 585-586

    Research output: Journal Publications and ReviewsEditorial Preface

    Scopus citations: 2
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  5. Modeling and analysis of software fault detection and correction process by considering time dependency

    Wu, Y. P., Hu, Q. P., Xie, M. & Ng, S. H., Dec 2007, In: IEEE Transactions on Reliability. 56, 4, p. 629-642

    Research output: Journal Publications and ReviewsRGC 21 - Publication in refereed journalpeer-review

    Scopus citations: 93
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  6. Classifying weak, and strong components using ROC analysis with application to burn-in

    Wu, S. & Xie, M., Sept 2007, In: IEEE Transactions on Reliability. 56, 3, p. 552-561

    Research output: Journal Publications and ReviewsRGC 21 - Publication in refereed journalpeer-review

    Scopus citations: 19
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  7. Reliability for sparsely connected consecutive-k systems

    Zhao, X., Cui, L. & Kuo, W., Sept 2007, In: IEEE Transactions on Reliability. 56, 3, p. 516-524

    Research output: Journal Publications and ReviewsRGC 21 - Publication in refereed journalpeer-review

    Scopus citations: 41
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  8. Published

    R-Impact: Reliability-based citation impact factor

    Kuo, W. & Rupe, J., Sept 2007, In: IEEE Transactions on Reliability. 56, 3, p. 366-367

    Research output: Journal Publications and ReviewsEditorial Preface

    Scopus citations: 16
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  9. Statistical models for hot electron degradation in nano-scaled MOSFET devices

    Bae, S. B., Kim, S., Kuo, W. & Kvam, P. H., Sept 2007, In: IEEE Transactions on Reliability. 56, 3, p. 392-400

    Research output: Journal Publications and ReviewsRGC 21 - Publication in refereed journalpeer-review

    Scopus citations: 25
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  10. Editorial: How reliable is teaching evaluation? The relationship of class size to teaching evaluation scores

    Kuo, W., Jun 2007, In: IEEE Transactions on Reliability. 56, 2, p. 178-181

    Research output: Journal Publications and ReviewsEditorial Preface

    Scopus citations: 7
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  12. 2006
  13. Challenges Related to Reliability in Nano Electronics

    KUO, W., Dec 2006, In: IEEE Transactions on Reliability. 55, 4, p. 569-570

    Research output: Journal Publications and ReviewsEditorial Preface

    Scopus citations: 30
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  14. Assessment for U.S. engineering programs

    Kuo, W., Mar 2006, In: IEEE Transactions on Reliability. 55, 1, p. 1-6

    Research output: Journal Publications and ReviewsRGC 21 - Publication in refereed journalpeer-review

    Scopus citations: 5
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  15. Multi-path heuristic for redundancy allocation: The tree heuristic

    Ha, C. & Kuo, W., Mar 2006, In: IEEE Transactions on Reliability. 55, 1, p. 37-43

    Research output: Journal Publications and ReviewsRGC 21 - Publication in refereed journalpeer-review

    Scopus citations: 15
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  16. 2005
  17. Some considerations on system burn-in

    Kim, K. O. & Kuo, W., Jun 2005, In: IEEE Transactions on Reliability. 54, 2, p. 207-214

    Research output: Journal Publications and ReviewsRGC 21 - Publication in refereed journalpeer-review

    Scopus citations: 18
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  18. Modeling and analysis of correlated software failures of multiple types

    Dai, Y., Xie, M. & Poh, K., Mar 2005, In: IEEE Transactions on Reliability. 54, 1, p. 100-106

    Research output: Journal Publications and ReviewsRGC 21 - Publication in refereed journalpeer-review

    Scopus citations: 78
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  19. 2004
  20. Specifying interdependence in networked systems

    Singpurwalla, N. D. & Kong, C., Sept 2004, In: IEEE Transactions on Reliability. 53, 3, p. 401-405

    Research output: Journal Publications and ReviewsRGC 21 - Publication in refereed journalpeer-review

    Scopus citations: 17
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  21. Optimal allocation of minimal and perfect repairs under resource constraints

    Cui, L., Kuo, W., Loh, H. T. & Xie, M., Jun 2004, In: IEEE Transactions on Reliability. 53, 2, p. 193-199

    Research output: Journal Publications and ReviewsRGC 21 - Publication in refereed journalpeer-review

    Scopus citations: 59
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  22. 2003
  23. Published

    IEEE Transactions on Reliability: Editor's Note

    Kuo, W., Dec 2003, In: IEEE Transactions on Reliability. 52, 4

    Research output: Journal Publications and ReviewsEditorial Preface

    Scopus citations: 1
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  24. A modified Weibull distribution

    Lai, C. D., Xie, M. & Murthy, D. N. P., Mar 2003, In: IEEE Transactions on Reliability. 52, 1, p. 33-37

    Research output: Journal Publications and ReviewsRGC 21 - Publication in refereed journalpeer-review

    Scopus citations: 414
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  25. A simple goodness-of-fit test for the power-law process, based on the Duane plot

    Gaudoin, O., Yang, B. & Xie, M., Mar 2003, In: IEEE Transactions on Reliability. 52, 1, p. 69-74

    Research output: Journal Publications and ReviewsRGC 21 - Publication in refereed journalpeer-review

    Scopus citations: 41
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  26. Testing the untestable: Reliability in the 21st century

    Bennett, T. R., Booker, J. M., Keller-McNulty, S. & Singpurwalla, N. D., Mar 2003, In: IEEE Transactions on Reliability. 52, 1, p. 118-124

    Research output: Journal Publications and ReviewsRGC 21 - Publication in refereed journalpeer-review

    Scopus citations: 24
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