IEEE Transactions on Reliability

IEEE Transactions on Reliability

ISSNs: 0018-9529, 0097-4552, 2168-2771, 2168-2755

Additional searchable ISSN (electronic): 1558-1721, 2168-2801, 2168-2798, 2168-2763

Institute of Electrical and Electronics Engineers, United States

Scopus rating (2022): CiteScore 10.1 SJR 1.296 SNIP 2.072

Journal

Journal Metrics

Research Output

  1. 2022
  2. Improving Autonomous Behavior Strategy Learning in an Unmanned Swarm System Through Knowledge Enhancement

    Zhang, T., Chai, L., Wang, S., Jin, J., Liu, X., Song, A. & Lan, Y., Jun 2022, In: IEEE Transactions on Reliability. 71, 2, p. 763-774 12 p.

    Research output: Journal Publications and ReviewsRGC 21 - Publication in refereed journalpeer-review

    Scopus citations: 5
    Check@CityULib
  3. 2014
  4. Accelerated degradation test planning using the inverse gaussian process

    Ye, Z., Chen, L., Tang, L. C. & Xie, M., Sept 2014, In: IEEE Transactions on Reliability. 63, 3, p. 750-763 6786428.

    Research output: Journal Publications and ReviewsRGC 21 - Publication in refereed journalpeer-review

    Scopus citations: 177
    Check@CityULib
  5. 2011
  6. Grid service reliability modeling and optimal task scheduling considering fault recovery

    Guo, S., Huang, H., Wang, Z. & Xie, M., Mar 2011, In: IEEE Transactions on Reliability. 60, 1, p. 263-274 5699967.

    Research output: Journal Publications and ReviewsRGC 21 - Publication in refereed journalpeer-review

    Scopus citations: 78
    Check@CityULib
  7. 2010
  8. Nonparametric estimation of decreasing mean residual life with type II censored data

    Shen, Y., Xie, M. & Tang, L. C., 2010, In: IEEE Transactions on Reliability. 59, 1, p. 38-44 5418920.

    Research output: Journal Publications and ReviewsRGC 21 - Publication in refereed journalpeer-review

    Scopus citations: 6
    Check@CityULib
  9. 2009
  10. A model for upside-down bathtub-shaped mean residual life and its properties

    Shen, Y., Tang, L. & Xie, M., 2009, In: IEEE Transactions on Reliability. 58, 3, p. 425-431

    Research output: Journal Publications and ReviewsRGC 21 - Publication in refereed journalpeer-review

    Scopus citations: 18
    Check@CityULib
  11. 2007
  12. Compatibility and simplicity: The fundamentals of reliability

    Kuo, W., Dec 2007, In: IEEE Transactions on Reliability. 56, 4, p. 585-586

    Research output: Journal Publications and ReviewsEditorial Preface

    Scopus citations: 2
    Check@CityULib
  13. Modeling and analysis of software fault detection and correction process by considering time dependency

    Wu, Y. P., Hu, Q. P., Xie, M. & Ng, S. H., Dec 2007, In: IEEE Transactions on Reliability. 56, 4, p. 629-642

    Research output: Journal Publications and ReviewsRGC 21 - Publication in refereed journalpeer-review

    Scopus citations: 93
    Check@CityULib
  14. Classifying weak, and strong components using ROC analysis with application to burn-in

    Wu, S. & Xie, M., Sept 2007, In: IEEE Transactions on Reliability. 56, 3, p. 552-561

    Research output: Journal Publications and ReviewsRGC 21 - Publication in refereed journalpeer-review

    Scopus citations: 19
    Check@CityULib
  15. Reliability for sparsely connected consecutive-k systems

    Zhao, X., Cui, L. & Kuo, W., Sept 2007, In: IEEE Transactions on Reliability. 56, 3, p. 516-524

    Research output: Journal Publications and ReviewsRGC 21 - Publication in refereed journalpeer-review

    Scopus citations: 41
    Check@CityULib
  16. Statistical models for hot electron degradation in nano-scaled MOSFET devices

    Bae, S. B., Kim, S., Kuo, W. & Kvam, P. H., Sept 2007, In: IEEE Transactions on Reliability. 56, 3, p. 392-400

    Research output: Journal Publications and ReviewsRGC 21 - Publication in refereed journalpeer-review

    Scopus citations: 25
    Check@CityULib
  17. Editorial: How reliable is teaching evaluation? The relationship of class size to teaching evaluation scores

    Kuo, W., Jun 2007, In: IEEE Transactions on Reliability. 56, 2, p. 178-181

    Research output: Journal Publications and ReviewsEditorial Preface

    Scopus citations: 7
    Check@CityULib
  18. Check@CityULib
  19. 2006
  20. Challenges Related to Reliability in Nano Electronics

    KUO, W., Dec 2006, In: IEEE Transactions on Reliability. 55, 4, p. 569-570

    Research output: Journal Publications and ReviewsEditorial Preface

    Scopus citations: 30
    Check@CityULib
  21. Assessment for U.S. engineering programs

    Kuo, W., Mar 2006, In: IEEE Transactions on Reliability. 55, 1, p. 1-6

    Research output: Journal Publications and ReviewsRGC 21 - Publication in refereed journalpeer-review

    Scopus citations: 5
    Check@CityULib
  22. Multi-path heuristic for redundancy allocation: The tree heuristic

    Ha, C. & Kuo, W., Mar 2006, In: IEEE Transactions on Reliability. 55, 1, p. 37-43

    Research output: Journal Publications and ReviewsRGC 21 - Publication in refereed journalpeer-review

    Scopus citations: 15
    Check@CityULib
  23. 2005
  24. Some considerations on system burn-in

    Kim, K. O. & Kuo, W., Jun 2005, In: IEEE Transactions on Reliability. 54, 2, p. 207-214

    Research output: Journal Publications and ReviewsRGC 21 - Publication in refereed journalpeer-review

    Scopus citations: 18
    Check@CityULib
  25. Modeling and analysis of correlated software failures of multiple types

    Dai, Y., Xie, M. & Poh, K., Mar 2005, In: IEEE Transactions on Reliability. 54, 1, p. 100-106

    Research output: Journal Publications and ReviewsRGC 21 - Publication in refereed journalpeer-review

    Scopus citations: 78
    Check@CityULib
  26. 2004
  27. Specifying interdependence in networked systems

    Singpurwalla, N. D. & Kong, C., Sept 2004, In: IEEE Transactions on Reliability. 53, 3, p. 401-405

    Research output: Journal Publications and ReviewsRGC 21 - Publication in refereed journalpeer-review

    Scopus citations: 17
    Check@CityULib
  28. Optimal allocation of minimal and perfect repairs under resource constraints

    Cui, L., Kuo, W., Loh, H. T. & Xie, M., Jun 2004, In: IEEE Transactions on Reliability. 53, 2, p. 193-199

    Research output: Journal Publications and ReviewsRGC 21 - Publication in refereed journalpeer-review

    Scopus citations: 59
    Check@CityULib
  29. 2003
  30. A modified Weibull distribution

    Lai, C. D., Xie, M. & Murthy, D. N. P., Mar 2003, In: IEEE Transactions on Reliability. 52, 1, p. 33-37

    Research output: Journal Publications and ReviewsRGC 21 - Publication in refereed journalpeer-review

    Scopus citations: 419
    Check@CityULib
Previous 1 2 3 Next