IEEE Transactions on Reliability

IEEE Transactions on Reliability

ISSNs: 0018-9529, 0097-4552, 2168-2771, 2168-2755

Additional searchable ISSN (Electronic): 1558-1721, 2168-2801, 2168-2798, 2168-2763

Institute of Electrical and Electronics Engineers, United States

Scopus rating (2017): CiteScore 3.49 SJR 1.444 SNIP 1.986

Journal

Journal Metrics
1 - 20 out of 87Page size: 20

Research Output

  1. 2018
  2. E-pub ahead of print

    Fast Semiconductor Reliability Assessments Using SPRT

    Chien, W. K., Chung, A. & Kuo, W., 18 Oct 2018, In : IEEE Transactions on Reliability.

    Research output: Journal Publications and Reviews (RGC: 21, 22, 62) › 21_Publication in refereed journal › Not applicable › peer-review

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  3. Published

    Investigating the Significance of the Bellwether Effect to Improve Software Effort Prediction: Further Empirical Study

    Mensah, S., Keung, J., MacDonell, S. G., Bosu, M. F. & Bennin, K. E., Sep 2018, In : IEEE Transactions on Reliability. 67, 3, p. 1176-1198

    Research output: Journal Publications and Reviews (RGC: 21, 22, 62) › 21_Publication in refereed journal › Not applicable › peer-review

    Scopus citations: 1
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  4. Published

    Reliability Modeling and Analysis of Load-Sharing Systems With Continuously Degrading Components

    Zhao, X., Liu, B. & Liu, Y., Sep 2018, In : IEEE Transactions on Reliability. 67, 3, p. 1096-1110

    Research output: Journal Publications and Reviews (RGC: 21, 22, 62) › 21_Publication in refereed journal › Not applicable › peer-review

    Scopus citations: 2
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  5. Published

    HistLock+: Precise Memory Access Maintenance Without Lockset Comparison for Complete Hybrid Data Race Detection

    Yang, J., Jiang, B. & Chan, W. K., 6 Aug 2018, In : IEEE Transactions on Reliability. 67, 3, p. 786-801

    Research output: Journal Publications and Reviews (RGC: 21, 22, 62) › 21_Publication in refereed journal › Not applicable › peer-review

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  6. Published

    Accelerated Degradation Tests Planning with Competing Failure Modes

    Zhao, X., Xu, J. & Liu, B., Mar 2018, In : IEEE Transactions on Reliability. 67, 1, p. 142-155

    Research output: Journal Publications and Reviews (RGC: 21, 22, 62) › 21_Publication in refereed journal › Not applicable › peer-review

    Scopus citations: 5
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  7. 2017
  8. Published

    Maintenance Scheduling for Multicomponent Systems with Hidden Failures

    Liu, B., Yeh, R., Xie, M. & Kuo, W., Dec 2017, In : IEEE Transactions on Reliability. 66, 4, p. 1280-1292

    Research output: Journal Publications and Reviews (RGC: 21, 22, 62) › 21_Publication in refereed journal › Not applicable › peer-review

    Scopus citations: 3
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  9. Published

    Preventive Maintenance Models Based on the Generalized Geometric Process

    Wang, G., Zhang, Y. & Yam, R. C. M., Dec 2017, In : IEEE Transactions on Reliability. 66, 4, p. 1380-1388

    Research output: Journal Publications and Reviews (RGC: 21, 22, 62) › 21_Publication in refereed journal › Not applicable › peer-review

    Scopus citations: 1
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  10. Published

    Statistical Modeling of Bearing Degradation Signals

    Wang, D. & Tsui, K., Dec 2017, In : IEEE Transactions on Reliability. 66, 4, p. 1331-1344

    Research output: Journal Publications and Reviews (RGC: 21, 22, 62) › 21_Publication in refereed journal › Not applicable › peer-review

    Scopus citations: 11
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  11. Published

    Accuracy Graphs of Spectrum-Based Fault Localization Formulas

    Tang, C. M., Chan, W. K., Yu, Y. T. & Zhang, Z., 1 Jun 2017, In : IEEE Transactions on Reliability. 66, 2, p. 403-424 2688487

    Research output: Journal Publications and Reviews (RGC: 21, 22, 62) › 21_Publication in refereed journal › Not applicable › peer-review

    Scopus citations: 10
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  12. 2016
  13. Published

    Optimal Design for Destructive Degradation Tests with Random Initial Degradation Values Using the Wiener Process

    Xiao, X. & Ye, Z., 1 Sep 2016, In : IEEE Transactions on Reliability. 65, 3, p. 1327-1342 7497478

    Research output: Journal Publications and Reviews (RGC: 21, 22, 62) › 21_Publication in refereed journal › Not applicable › peer-review

    Scopus citations: 13
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  14. Published

    To What Extent is Stress Testing of Android TV Applications Automated in Industrial Environments?

    Jiang, B., Chen, P., Chan, W. K. & Zhang, X., 1 Sep 2016, In : IEEE Transactions on Reliability. 65, 3, p. 1223-1239 7298477

    Research output: Journal Publications and Reviews (RGC: 21, 22, 62) › 21_Publication in refereed journal › Not applicable › peer-review

    Scopus citations: 3
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  15. Published

    Optimal Cable Laying Across an Earthquake Fault Line Considering Elliptical Failures

    Cao, C., Wang, Z., Zukerman, M., Manton, J. H., Bensoussan, A. & Wang, Y., Sep 2016, In : IEEE Transactions on Reliability. 65, 3, p. 1536-1550

    Research output: Journal Publications and Reviews (RGC: 21, 22, 62) › 21_Publication in refereed journal › Not applicable › peer-review

    Scopus citations: 3
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  16. 2015
  17. Published

    Reflections on Reliability: Key Events 1999-2015

    Kuo, W., 1 Sep 2015, In : IEEE Transactions on Reliability. 64, 3, p. 838-839 7163369

    Research output: Journal Publications and Reviews (RGC: 21, 22, 62) › Editorial Preface › Not applicable

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  18. Published

    Accelerated degradation analysis for the quality of a system based on the gamma process

    Ling, M. H., Tsui, K. L. & Balakrishnan, N., 1 Mar 2015, In : IEEE Transactions on Reliability. 64, 1, p. 463-472 6860326

    Research output: Journal Publications and Reviews (RGC: 21, 22, 62) › 21_Publication in refereed journal › Not applicable › peer-review

    Scopus citations: 38
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  19. Published

    Risk and reliability are part of our life

    Kuo, W., 2015, In : IEEE Transactions on Reliability. 64, 1, p. 2-3 7051316

    Research output: Journal Publications and Reviews (RGC: 21, 22, 62) › 21_Publication in refereed journal › Not applicable › peer-review

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  20. 2014

  21. Accelerated degradation test planning using the inverse gaussian process

    Ye, Z., Chen, L., Tang, L. C. & Xie, M., Sep 2014, In : IEEE Transactions on Reliability. 63, 3, p. 750-763 6786428

    Research output: Journal Publications and Reviews (RGC: 21, 22, 62) › 21_Publication in refereed journal › Not applicable › peer-review

    Scopus citations: 63
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  22. 2013
  23. Published

    A bivariate maintenance policy for multi-state repairable systems with monotone process

    Zhang, M., Xie, M. & Gaudoin, O., Dec 2013, In : IEEE Transactions on Reliability. 62, 4, p. 876-886 6634272

    Research output: Journal Publications and Reviews (RGC: 21, 22, 62) › 21_Publication in refereed journal › Not applicable › peer-review

    Scopus citations: 14
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  24. Published

    Degradation data analysis using wiener processes with measurement errors

    Ye, Z., Wang, Y., Tsui, K. & Pecht, M., Dec 2013, In : IEEE Transactions on Reliability. 62, 4, p. 772-780 6632957

    Research output: Journal Publications and Reviews (RGC: 21, 22, 62) › 21_Publication in refereed journal › Not applicable › peer-review

    Scopus citations: 133
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  25. Published

    A bayesian approach for system reliability analysis with multilevel pass-fail, lifetime and degradation data sets

    Peng, W., Huang, H., Xie, M., Yang, Y. & Liu, Y., 2013, In : IEEE Transactions on Reliability. 62, 3, p. 689-699 6550896

    Research output: Journal Publications and Reviews (RGC: 21, 22, 62) › 21_Publication in refereed journal › Not applicable › peer-review

    Scopus citations: 32
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  26. Published

    Evaluation and comparison of mixed effects model based prognosis for hard failure

    Son, J., Zhou, Q., Zhou, S., Mao, X. & Salman, M., 2013, In : IEEE Transactions on Reliability. 62, 2, p. 379-394 6509984

    Research output: Journal Publications and Reviews (RGC: 21, 22, 62) › 21_Publication in refereed journal › Not applicable › peer-review

    Scopus citations: 28
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