IEEE Transactions on Reliability

IEEE Transactions on Reliability

ISSNs: 0018-9529, 0097-4552, 2168-2771, 2168-2755

Additional searchable ISSN (Electronic): 1558-1721, 2168-2801, 2168-2798, 2168-2763

Institute of Electrical and Electronics Engineers, United States

Scopus rating (2020): CiteScore 7.7 SJR 1.032 SNIP 2.122

Journal

Journal Metrics
1 - 20 out of 97Page size: 20

Research Output

  1. 2021
  2. Online published

    DeepEutaxy: Diversity in Weight Search Direction for Fixing Deep Learning Model Training through Batch Prioritization

    Zhang, H. & Chan, W. K., 18 Jun 2021, (Online published) In: IEEE Transactions on Reliability. 70, 3, p. 1040-1052 13 p.

    Research output: Journal Publications and Reviews (RGC: 21, 22, 62) › 21_Publication in refereed journal › peer-review

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  3. Published

    Guest Editorial: Special Section on IEEE International Conference on Software Quality, Reliability, and Security (QRS) 2020

    CHAN, W. K., NAGAPPAN, M. & BUDNIK, C. J., Jun 2021, In: IEEE Transactions on Reliability. 70, 2, p. 442

    Research output: Journal Publications and Reviews (RGC: 21, 22, 62) › Editorial Preface

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  4. Published

    A Prime-Logarithmic Method for Optimal Reliability Design

    Li, H., Huang, Y., Fang, S. & Kuo, W., Mar 2021, In: IEEE Transactions on Reliability. 70, 1, p. 146-162 9206542.

    Research output: Journal Publications and Reviews (RGC: 21, 22, 62) › 21_Publication in refereed journal › peer-review

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  5. 2020
  6. Published

    Imperfect Preventive Maintenance Policies With Unpunctual Execution

    Wang, X., Zhou, H., Parlikad, A. K. & Xie, M., Dec 2020, In: IEEE Transactions on Reliability. 69, 4, p. 1480-1492 13 p., 9069302.

    Research output: Journal Publications and Reviews (RGC: 21, 22, 62) › 21_Publication in refereed journal › peer-review

    Scopus citations: 15
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  7. Published

    Guest Editorial: Crisis Management - From Nuclear Accidents to Outbreaks of COVID-19 and Infectious Diseases

    Kuo, W. & He, J., Sep 2020, In: IEEE Transactions on Reliability. 69, 3, p. 846-850 9181848.

    Research output: Journal Publications and Reviews (RGC: 21, 22, 62) › Editorial Preface

    Scopus citations: 8
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  8. Published

    Improving Fault-Localization Accuracy by Referencing Debugging History to Alleviate Structure Bias in Code Suspiciousness

    Zhang, L., Li, Z., Feng, Y., Zhang, Z., Chan, W. K., Zhang, J. & Zhou, Y., Sep 2020, In: IEEE Transactions on Reliability. 69, 3, p. 1021-1049 9082019.

    Research output: Journal Publications and Reviews (RGC: 21, 22, 62) › 21_Publication in refereed journal › peer-review

    Scopus citations: 1
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  9. Published

    Improving Ranking-Oriented Defect Prediction Using a Cost-Sensitive Ranking SVM

    Yu, X., Liu, J., Keung, J. W., Li, Q., Bennin, K. E., Xu, Z., Wang, J. & 1 others, Cui, X., Mar 2020, In: IEEE Transactions on Reliability. 69, 1, p. 139-153

    Research output: Journal Publications and Reviews (RGC: 21, 22, 62) › 21_Publication in refereed journal › peer-review

    Scopus citations: 7
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  10. Published

    Process Variation Aware Read Performance Improvement for LDPC-Based nand Flash Memory

    Li, Q., Shi, L., Di, Y., Gao, C., Ji, C., Liang, Y. & Xue, C. J., Mar 2020, In: IEEE Transactions on Reliability. 69, 1, p. 310-321

    Research output: Journal Publications and Reviews (RGC: 21, 22, 62) › 21_Publication in refereed journal › peer-review

    Scopus citations: 3
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  11. 2019
  12. Published

    A Systematic Study on Factors Impacting GUI Traversal-Based Test Case Generation Techniques for Android Applications

    Jiang, B., Zhang, Y., Chan, W. K. & Zhang, Z., Sep 2019, In: IEEE Transactions on Reliability. 68, 3, p. 913-926

    Research output: Journal Publications and Reviews (RGC: 21, 22, 62) › 21_Publication in refereed journal › peer-review

    Scopus citations: 2
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  13. Published

    Dynamic Random Testing: Technique and Experimental Evaluation

    Pei, H., Cai, K., Yin, B., Mathur, A. P. & Xie, M., Sep 2019, In: IEEE Transactions on Reliability. 68, 3, p. 872-892

    Research output: Journal Publications and Reviews (RGC: 21, 22, 62) › 21_Publication in refereed journal › peer-review

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  14. Published

    Fast Semiconductor Reliability Assessments Using SPRT

    Chien, W. K., Chung, A. & Kuo, W., Jun 2019, In: IEEE Transactions on Reliability. 68, 2, p. 526-538

    Research output: Journal Publications and Reviews (RGC: 21, 22, 62) › 21_Publication in refereed journal › peer-review

    Scopus citations: 1
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  15. 2018
  16. Published

    Investigating the Significance of the Bellwether Effect to Improve Software Effort Prediction: Further Empirical Study

    Mensah, S., Keung, J., MacDonell, S. G., Bosu, M. F. & Bennin, K. E., Sep 2018, In: IEEE Transactions on Reliability. 67, 3, p. 1176-1198

    Research output: Journal Publications and Reviews (RGC: 21, 22, 62) › 21_Publication in refereed journal › peer-review

    Scopus citations: 4
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  17. Published

    Reliability Modeling and Analysis of Load-Sharing Systems With Continuously Degrading Components

    Zhao, X., Liu, B. & Liu, Y., Sep 2018, In: IEEE Transactions on Reliability. 67, 3, p. 1096-1110

    Research output: Journal Publications and Reviews (RGC: 21, 22, 62) › 21_Publication in refereed journal › peer-review

    Scopus citations: 33
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  18. Published

    HistLock+: Precise Memory Access Maintenance Without Lockset Comparison for Complete Hybrid Data Race Detection

    Yang, J., Jiang, B. & Chan, W. K., 6 Aug 2018, In: IEEE Transactions on Reliability. 67, 3, p. 786-801

    Research output: Journal Publications and Reviews (RGC: 21, 22, 62) › 21_Publication in refereed journal › peer-review

    Scopus citations: 6
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  19. Published

    Accelerated Degradation Tests Planning with Competing Failure Modes

    Zhao, X., Xu, J. & Liu, B., Mar 2018, In: IEEE Transactions on Reliability. 67, 1, p. 142-155

    Research output: Journal Publications and Reviews (RGC: 21, 22, 62) › 21_Publication in refereed journal › peer-review

    Scopus citations: 30
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  20. 2017
  21. Published

    Maintenance Scheduling for Multicomponent Systems with Hidden Failures

    Liu, B., Yeh, R., Xie, M. & Kuo, W., Dec 2017, In: IEEE Transactions on Reliability. 66, 4, p. 1280-1292

    Research output: Journal Publications and Reviews (RGC: 21, 22, 62) › 21_Publication in refereed journal › peer-review

    Scopus citations: 26
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  22. Published

    Preventive Maintenance Models Based on the Generalized Geometric Process

    Wang, G., Zhang, Y. & Yam, R. C. M., Dec 2017, In: IEEE Transactions on Reliability. 66, 4, p. 1380-1388

    Research output: Journal Publications and Reviews (RGC: 21, 22, 62) › 21_Publication in refereed journal › peer-review

    Scopus citations: 13
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  23. Published

    Statistical Modeling of Bearing Degradation Signals

    Wang, D. & Tsui, K., Dec 2017, In: IEEE Transactions on Reliability. 66, 4, p. 1331-1344

    Research output: Journal Publications and Reviews (RGC: 21, 22, 62) › 21_Publication in refereed journal › peer-review

    Scopus citations: 49
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  24. Published

    Accuracy Graphs of Spectrum-Based Fault Localization Formulas

    Tang, C. M., Chan, W. K., Yu, Y. T. & Zhang, Z., Jun 2017, In: IEEE Transactions on Reliability. 66, 2, p. 403-424 2688487.

    Research output: Journal Publications and Reviews (RGC: 21, 22, 62) › 21_Publication in refereed journal › peer-review

    Scopus citations: 19
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  25. 2016
  26. Published

    To What Extent is Stress Testing of Android TV Applications Automated in Industrial Environments?

    Jiang, B., Chen, P., Chan, W. K. & Zhang, X., 1 Sep 2016, In: IEEE Transactions on Reliability. 65, 3, p. 1223-1239 7298477.

    Research output: Journal Publications and Reviews (RGC: 21, 22, 62) › 21_Publication in refereed journal › peer-review

    Scopus citations: 5
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