IEEE Transactions on Reliability

IEEE Transactions on Reliability

ISSNs: 0018-9529, 0097-4552, 2168-2771, 2168-2755

Additional searchable ISSN (Electronic): 1558-1721, 2168-2801, 2168-2798, 2168-2763

Institute of Electrical and Electronics Engineers, United States

Scopus rating (2019): CiteScore 7.2 SJR 1.099 SNIP 1.838

Journal

Journal Metrics
1 - 20 out of 94Page size: 20

Research Output

  1. 2020
  2. Published

    Guest Editorial: Crisis Management - From Nuclear Accidents to Outbreaks of COVID-19 and Infectious Diseases

    Kuo, W. & He, J., Sep 2020, In : IEEE Transactions on Reliability. 69, 3, p. 846-850 9181848.

    Research output: Journal Publications and Reviews (RGC: 21, 22, 62) › Editorial Preface

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  3. Published

    Improving Fault-Localization Accuracy by Referencing Debugging History to Alleviate Structure Bias in Code Suspiciousness

    Zhang, L., Li, Z., Feng, Y., Zhang, Z., Chan, W. K., Zhang, J. & Zhou, Y., Sep 2020, In : IEEE Transactions on Reliability. 69, 3, p. 1021-1049 9082019.

    Research output: Journal Publications and Reviews (RGC: 21, 22, 62) › 21_Publication in refereed journal

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  4. Online published

    Imperfect Preventive Maintenance Policies With Unpunctual Execution

    Wang, X., Zhou, H., Parlikad, A. K. & Xie, M., 16 Apr 2020, In : IEEE Transactions on Reliability. 13 p.

    Research output: Journal Publications and Reviews (RGC: 21, 22, 62) › 21_Publication in refereed journal

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  5. Published

    Improving Ranking-Oriented Defect Prediction Using a Cost-Sensitive Ranking SVM

    Yu, X., Liu, J., Keung, J. W., Li, Q., Bennin, K. E., Xu, Z., Wang, J. & 1 others, Cui, X., Mar 2020, In : IEEE Transactions on Reliability. 69, 1, p. 139-153

    Research output: Journal Publications and Reviews (RGC: 21, 22, 62) › 21_Publication in refereed journal

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  6. Published

    Process Variation Aware Read Performance Improvement for LDPC-Based nand Flash Memory

    Li, Q., Shi, L., Di, Y., Gao, C., Ji, C., Liang, Y. & Xue, C. J., Mar 2020, In : IEEE Transactions on Reliability. 69, 1, p. 310-321

    Research output: Journal Publications and Reviews (RGC: 21, 22, 62) › 21_Publication in refereed journal

    Scopus citations: 1
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  7. 2019
  8. Published

    A Systematic Study on Factors Impacting GUI Traversal-Based Test Case Generation Techniques for Android Applications

    Jiang, B., Zhang, Y., Chan, W. K. & Zhang, Z., Sep 2019, In : IEEE Transactions on Reliability. 68, 3, p. 913-926

    Research output: Journal Publications and Reviews (RGC: 21, 22, 62) › 21_Publication in refereed journal

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  9. Published

    Dynamic Random Testing: Technique and Experimental Evaluation

    Pei, H., Cai, K., Yin, B., Mathur, A. P. & Xie, M., Sep 2019, In : IEEE Transactions on Reliability. 68, 3, p. 872-892

    Research output: Journal Publications and Reviews (RGC: 21, 22, 62) › 21_Publication in refereed journal

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  10. Published

    Fast Semiconductor Reliability Assessments Using SPRT

    Chien, W. K., Chung, A. & Kuo, W., Jun 2019, In : IEEE Transactions on Reliability. 68, 2, p. 526-538

    Research output: Journal Publications and Reviews (RGC: 21, 22, 62) › 21_Publication in refereed journal

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  11. 2018
  12. Published

    Investigating the Significance of the Bellwether Effect to Improve Software Effort Prediction: Further Empirical Study

    Mensah, S., Keung, J., MacDonell, S. G., Bosu, M. F. & Bennin, K. E., Sep 2018, In : IEEE Transactions on Reliability. 67, 3, p. 1176-1198

    Research output: Journal Publications and Reviews (RGC: 21, 22, 62) › 21_Publication in refereed journal

    Scopus citations: 3
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  13. Published

    Reliability Modeling and Analysis of Load-Sharing Systems With Continuously Degrading Components

    Zhao, X., Liu, B. & Liu, Y., Sep 2018, In : IEEE Transactions on Reliability. 67, 3, p. 1096-1110

    Research output: Journal Publications and Reviews (RGC: 21, 22, 62) › 21_Publication in refereed journal

    Scopus citations: 21
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  14. Published

    HistLock+: Precise Memory Access Maintenance Without Lockset Comparison for Complete Hybrid Data Race Detection

    Yang, J., Jiang, B. & Chan, W. K., 6 Aug 2018, In : IEEE Transactions on Reliability. 67, 3, p. 786-801

    Research output: Journal Publications and Reviews (RGC: 21, 22, 62) › 21_Publication in refereed journal

    Scopus citations: 3
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  15. Published

    Accelerated Degradation Tests Planning with Competing Failure Modes

    Zhao, X., Xu, J. & Liu, B., Mar 2018, In : IEEE Transactions on Reliability. 67, 1, p. 142-155

    Research output: Journal Publications and Reviews (RGC: 21, 22, 62) › 21_Publication in refereed journal

    Scopus citations: 22
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  16. 2017
  17. Published

    Maintenance Scheduling for Multicomponent Systems with Hidden Failures

    Liu, B., Yeh, R., Xie, M. & Kuo, W., Dec 2017, In : IEEE Transactions on Reliability. 66, 4, p. 1280-1292

    Research output: Journal Publications and Reviews (RGC: 21, 22, 62) › 21_Publication in refereed journal

    Scopus citations: 19
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  18. Published

    Preventive Maintenance Models Based on the Generalized Geometric Process

    Wang, G., Zhang, Y. & Yam, R. C. M., Dec 2017, In : IEEE Transactions on Reliability. 66, 4, p. 1380-1388

    Research output: Journal Publications and Reviews (RGC: 21, 22, 62) › 21_Publication in refereed journal

    Scopus citations: 4
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  19. Published

    Statistical Modeling of Bearing Degradation Signals

    Wang, D. & Tsui, K., Dec 2017, In : IEEE Transactions on Reliability. 66, 4, p. 1331-1344

    Research output: Journal Publications and Reviews (RGC: 21, 22, 62) › 21_Publication in refereed journal

    Scopus citations: 31
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  20. Published

    Accuracy Graphs of Spectrum-Based Fault Localization Formulas

    Tang, C. M., Chan, W. K., Yu, Y. T. & Zhang, Z., Jun 2017, In : IEEE Transactions on Reliability. 66, 2, p. 403-424 2688487.

    Research output: Journal Publications and Reviews (RGC: 21, 22, 62) › 21_Publication in refereed journal

    Scopus citations: 16
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  21. 2016
  22. Published

    To What Extent is Stress Testing of Android TV Applications Automated in Industrial Environments?

    Jiang, B., Chen, P., Chan, W. K. & Zhang, X., 1 Sep 2016, In : IEEE Transactions on Reliability. 65, 3, p. 1223-1239 7298477.

    Research output: Journal Publications and Reviews (RGC: 21, 22, 62) › 21_Publication in refereed journal

    Scopus citations: 5
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  23. Published

    Optimal Cable Laying Across an Earthquake Fault Line Considering Elliptical Failures

    Cao, C., Wang, Z., Zukerman, M., Manton, J. H., Bensoussan, A. & Wang, Y., Sep 2016, In : IEEE Transactions on Reliability. 65, 3, p. 1536-1550

    Research output: Journal Publications and Reviews (RGC: 21, 22, 62) › 21_Publication in refereed journal

    Scopus citations: 7
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  24. Published

    Optimal Design for Destructive Degradation Tests with Random Initial Degradation Values Using the Wiener Process

    Xiao, X. & Ye, Z., Sep 2016, In : IEEE Transactions on Reliability. 65, 3, p. 1327-1342 7497478.

    Research output: Journal Publications and Reviews (RGC: 21, 22, 62) › 21_Publication in refereed journal

    Scopus citations: 23
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  25. 2015
  26. Published

    Reflections on Reliability: Key Events 1999-2015

    Kuo, W., 1 Sep 2015, In : IEEE Transactions on Reliability. 64, 3, p. 838-839 7163369.

    Research output: Journal Publications and Reviews (RGC: 21, 22, 62) › Editorial Preface

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