IEEE Transactions on Reliability
IEEE Transactions on Reliability
ISSNs: 0018-9529, 0097-4552, 2168-2771, 2168-2755
Additional searchable ISSN (Electronic): 1558-1721, 2168-2801, 2168-2798, 2168-2763
Institute of Electrical and Electronics Engineers, United States
Scopus rating (2021): CiteScore 9.2 SJR 1.253 SNIP 2.196
Journal
Research Output
- 2023
- Online published
AttSum: A Deep Attention-Based Summarization Model for Bug Report Title Generation
Ma, X., Keung, J. W., Yu, X., Zou, H., Zhang, J. & Li, Y., 24 Jan 2023, (Online published) In: IEEE Transactions on Reliability. 15 p.Research output: Journal Publications and Reviews (RGC: 21, 22, 62) › 21_Publication in refereed journal › peer-review
Scopus citations: 1 - Online published
Robust Statistical Modeling of Heterogeneity for Repairable Systems Using Multivariate Gaussian Convolution Processes
Cui, D., Sun, Q. & Xie, M., 23 Jan 2023, (Online published) In: IEEE Transactions on Reliability.Research output: Journal Publications and Reviews (RGC: 21, 22, 62) › 21_Publication in refereed journal › peer-review
- 2022
- Online published
Sequential Bayesian Planning for Accelerated Degradation Tests Considering Sensor Degradation
He, K., Sun, Q., Xie, M. & Kuo, W., 6 Dec 2022, (Online published) In: IEEE Transactions on Reliability. 11 p.Research output: Journal Publications and Reviews (RGC: 21, 22, 62) › 21_Publication in refereed journal › peer-review
Scopus citations: 1 - Online published
An Overview of Adaptive-Surrogate-Model-Assisted Methods for Reliability-Based Design Optimization
Ling, C., Kuo, W. & Xie, M., 5 Sep 2022, (Online published) In: IEEE Transactions on Reliability.Research output: Journal Publications and Reviews (RGC: 21, 22, 62) › 21_Publication in refereed journal › peer-review
Scopus citations: 3 - Online published
Component Reliability of a Class of Regular Networks and Its Applications
Sun, X., Fan, J., Kan, S., Fan, W. & Jia, X., 10 Aug 2022, (Online published) In: IEEE Transactions on Reliability.Research output: Journal Publications and Reviews (RGC: 21, 22, 62) › 21_Publication in refereed journal › peer-review
Scopus citations: 1 - Online published
Davida: A Decentralization Approach to Localizing Transaction Sequences for Debugging Transactional Atomicity Violations
Ma, X., Ashraf, I. & Chan, W. K., 7 Jun 2022, (Online published) In: IEEE Transactions on Reliability. 19 p.Research output: Journal Publications and Reviews (RGC: 21, 22, 62) › 21_Publication in refereed journal › peer-review
Improving Autonomous Behavior Strategy Learning in an Unmanned Swarm System Through Knowledge Enhancement
Zhang, T., Chai, L., Wang, S., Jin, J., Liu, X., Song, A. & Lan, Y., Jun 2022, In: IEEE Transactions on Reliability. 71, 2, p. 763-774 12 p.Research output: Journal Publications and Reviews (RGC: 21, 22, 62) › 21_Publication in refereed journal › peer-review
- Online published
Fault Diagnosis Based on Subsystem Structures of Data Center Network BCube
Lv, M., Fan, J., Fan, W. & Jia, X., 8 Mar 2022, (Online published) In: IEEE Transactions on Reliability. 10 p.Research output: Journal Publications and Reviews (RGC: 21, 22, 62) › 21_Publication in refereed journal › peer-review
Scopus citations: 1 - 2021
- Published
DeepEutaxy: Diversity in Weight Search Direction for Fixing Deep Learning Model Training through Batch Prioritization
Zhang, H. & Chan, W. K., Sep 2021, In: IEEE Transactions on Reliability. 70, 3, p. 1040-1052 13 p.Research output: Journal Publications and Reviews (RGC: 21, 22, 62) › 21_Publication in refereed journal › peer-review
- Published
Guest Editorial: Special Section on IEEE International Conference on Software Quality, Reliability, and Security (QRS) 2020
CHAN, W. K., NAGAPPAN, M. & BUDNIK, C. J., Jun 2021, In: IEEE Transactions on Reliability. 70, 2, p. 442Research output: Journal Publications and Reviews (RGC: 21, 22, 62) › Editorial Preface
- Published
A Prime-Logarithmic Method for Optimal Reliability Design
Li, H., Huang, Y., Fang, S. & Kuo, W., Mar 2021, In: IEEE Transactions on Reliability. 70, 1, p. 146-162 9206542.Research output: Journal Publications and Reviews (RGC: 21, 22, 62) › 21_Publication in refereed journal › peer-review
Scopus citations: 2 - 2020
- Published
Imperfect Preventive Maintenance Policies With Unpunctual Execution
Wang, X., Zhou, H., Parlikad, A. K. & Xie, M., Dec 2020, In: IEEE Transactions on Reliability. 69, 4, p. 1480-1492 13 p., 9069302.Research output: Journal Publications and Reviews (RGC: 21, 22, 62) › 21_Publication in refereed journal › peer-review
Scopus citations: 23 - Published
Guest Editorial: Crisis Management - From Nuclear Accidents to Outbreaks of COVID-19 and Infectious Diseases
Kuo, W. & He, J., Sep 2020, In: IEEE Transactions on Reliability. 69, 3, p. 846-850 9181848.Research output: Journal Publications and Reviews (RGC: 21, 22, 62) › Editorial Preface
Scopus citations: 17 - Published
Improving Fault-Localization Accuracy by Referencing Debugging History to Alleviate Structure Bias in Code Suspiciousness
Zhang, L., Li, Z., Feng, Y., Zhang, Z., Chan, W. K., Zhang, J. & Zhou, Y., Sep 2020, In: IEEE Transactions on Reliability. 69, 3, p. 1021-1049 9082019.Research output: Journal Publications and Reviews (RGC: 21, 22, 62) › 21_Publication in refereed journal › peer-review
Scopus citations: 5 - Published
Improving Ranking-Oriented Defect Prediction Using a Cost-Sensitive Ranking SVM
Yu, X., Liu, J., Keung, J. W., Li, Q., Bennin, K. E., Xu, Z., Wang, J., & 1 others , Mar 2020, In: IEEE Transactions on Reliability. 69, 1, p. 139-153Research output: Journal Publications and Reviews (RGC: 21, 22, 62) › 21_Publication in refereed journal › peer-review
Scopus citations: 23 - Published
Process Variation Aware Read Performance Improvement for LDPC-Based nand Flash Memory
Li, Q., Shi, L., Di, Y., Gao, C., Ji, C., Liang, Y. & Xue, C. J., Mar 2020, In: IEEE Transactions on Reliability. 69, 1, p. 310-321Research output: Journal Publications and Reviews (RGC: 21, 22, 62) › 21_Publication in refereed journal › peer-review
Scopus citations: 11 - 2019
- Published
A Systematic Study on Factors Impacting GUI Traversal-Based Test Case Generation Techniques for Android Applications
Jiang, B., Zhang, Y., Chan, W. K. & Zhang, Z., Sep 2019, In: IEEE Transactions on Reliability. 68, 3, p. 913-926Research output: Journal Publications and Reviews (RGC: 21, 22, 62) › 21_Publication in refereed journal › peer-review
Scopus citations: 3 - Published
Dynamic Random Testing: Technique and Experimental Evaluation
Pei, H., Cai, K., Yin, B., Mathur, A. P. & Xie, M., Sep 2019, In: IEEE Transactions on Reliability. 68, 3, p. 872-892Research output: Journal Publications and Reviews (RGC: 21, 22, 62) › 21_Publication in refereed journal › peer-review
- Published
Fast Semiconductor Reliability Assessments Using SPRT
Chien, W. K., Chung, A. & Kuo, W., Jun 2019, In: IEEE Transactions on Reliability. 68, 2, p. 526-538Research output: Journal Publications and Reviews (RGC: 21, 22, 62) › 21_Publication in refereed journal › peer-review
Scopus citations: 3 - 2018
- Published
HistLock+: Precise Memory Access Maintenance Without Lockset Comparison for Complete Hybrid Data Race Detection
Yang, J., Jiang, B. & Chan, W. K., Sep 2018, In: IEEE Transactions on Reliability. 67, 3, p. 786-801Research output: Journal Publications and Reviews (RGC: 21, 22, 62) › 21_Publication in refereed journal › peer-review
Scopus citations: 8