IEEE Transactions on Reliability

IEEE Transactions on Reliability

ISSNs: 0018-9529, 0097-4552, 2168-2771, 2168-2755

Additional searchable ISSN (Electronic): 1558-1721, 2168-2801, 2168-2798, 2168-2763

Institute of Electrical and Electronics Engineers, United States

Scopus rating (2021): CiteScore 9.2 SJR 1.253 SNIP 2.196

Journal

Journal Metrics
1 - 20 out of 105Page size: 20

Research Output

  1. 2023
  2. Online published

    AttSum: A Deep Attention-Based Summarization Model for Bug Report Title Generation

    Ma, X., Keung, J. W., Yu, X., Zou, H., Zhang, J. & Li, Y., 24 Jan 2023, (Online published) In: IEEE Transactions on Reliability. 15 p.

    Research output: Journal Publications and Reviews (RGC: 21, 22, 62) › 21_Publication in refereed journal › peer-review

    Scopus citations: 1
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  3. Online published

    Robust Statistical Modeling of Heterogeneity for Repairable Systems Using Multivariate Gaussian Convolution Processes

    Cui, D., Sun, Q. & Xie, M., 23 Jan 2023, (Online published) In: IEEE Transactions on Reliability.

    Research output: Journal Publications and Reviews (RGC: 21, 22, 62) › 21_Publication in refereed journal › peer-review

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  4. 2022
  5. Online published

    Sequential Bayesian Planning for Accelerated Degradation Tests Considering Sensor Degradation

    He, K., Sun, Q., Xie, M. & Kuo, W., 6 Dec 2022, (Online published) In: IEEE Transactions on Reliability. 11 p.

    Research output: Journal Publications and Reviews (RGC: 21, 22, 62) › 21_Publication in refereed journal › peer-review

    Scopus citations: 1
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  6. Online published

    An Overview of Adaptive-Surrogate-Model-Assisted Methods for Reliability-Based Design Optimization

    Ling, C., Kuo, W. & Xie, M., 5 Sep 2022, (Online published) In: IEEE Transactions on Reliability.

    Research output: Journal Publications and Reviews (RGC: 21, 22, 62) › 21_Publication in refereed journal › peer-review

    Scopus citations: 3
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  7. Online published

    Component Reliability of a Class of Regular Networks and Its Applications

    Sun, X., Fan, J., Kan, S., Fan, W. & Jia, X., 10 Aug 2022, (Online published) In: IEEE Transactions on Reliability.

    Research output: Journal Publications and Reviews (RGC: 21, 22, 62) › 21_Publication in refereed journal › peer-review

    Scopus citations: 1
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  8. Online published

    Davida: A Decentralization Approach to Localizing Transaction Sequences for Debugging Transactional Atomicity Violations

    Ma, X., Ashraf, I. & Chan, W. K., 7 Jun 2022, (Online published) In: IEEE Transactions on Reliability. 19 p.

    Research output: Journal Publications and Reviews (RGC: 21, 22, 62) › 21_Publication in refereed journal › peer-review

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  9. Improving Autonomous Behavior Strategy Learning in an Unmanned Swarm System Through Knowledge Enhancement

    Zhang, T., Chai, L., Wang, S., Jin, J., Liu, X., Song, A. & Lan, Y., Jun 2022, In: IEEE Transactions on Reliability. 71, 2, p. 763-774 12 p.

    Research output: Journal Publications and Reviews (RGC: 21, 22, 62) › 21_Publication in refereed journal › peer-review

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  10. Online published

    Fault Diagnosis Based on Subsystem Structures of Data Center Network BCube

    Lv, M., Fan, J., Fan, W. & Jia, X., 8 Mar 2022, (Online published) In: IEEE Transactions on Reliability. 10 p.

    Research output: Journal Publications and Reviews (RGC: 21, 22, 62) › 21_Publication in refereed journal › peer-review

    Scopus citations: 1
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  11. 2021
  12. Published

    DeepEutaxy: Diversity in Weight Search Direction for Fixing Deep Learning Model Training through Batch Prioritization

    Zhang, H. & Chan, W. K., Sep 2021, In: IEEE Transactions on Reliability. 70, 3, p. 1040-1052 13 p.

    Research output: Journal Publications and Reviews (RGC: 21, 22, 62) › 21_Publication in refereed journal › peer-review

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  13. Published

    Guest Editorial: Special Section on IEEE International Conference on Software Quality, Reliability, and Security (QRS) 2020

    CHAN, W. K., NAGAPPAN, M. & BUDNIK, C. J., Jun 2021, In: IEEE Transactions on Reliability. 70, 2, p. 442

    Research output: Journal Publications and Reviews (RGC: 21, 22, 62) › Editorial Preface

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  14. Published

    A Prime-Logarithmic Method for Optimal Reliability Design

    Li, H., Huang, Y., Fang, S. & Kuo, W., Mar 2021, In: IEEE Transactions on Reliability. 70, 1, p. 146-162 9206542.

    Research output: Journal Publications and Reviews (RGC: 21, 22, 62) › 21_Publication in refereed journal › peer-review

    Scopus citations: 2
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  15. 2020
  16. Published

    Imperfect Preventive Maintenance Policies With Unpunctual Execution

    Wang, X., Zhou, H., Parlikad, A. K. & Xie, M., Dec 2020, In: IEEE Transactions on Reliability. 69, 4, p. 1480-1492 13 p., 9069302.

    Research output: Journal Publications and Reviews (RGC: 21, 22, 62) › 21_Publication in refereed journal › peer-review

    Scopus citations: 23
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  17. Published

    Guest Editorial: Crisis Management - From Nuclear Accidents to Outbreaks of COVID-19 and Infectious Diseases

    Kuo, W. & He, J., Sep 2020, In: IEEE Transactions on Reliability. 69, 3, p. 846-850 9181848.

    Research output: Journal Publications and Reviews (RGC: 21, 22, 62) › Editorial Preface

    Scopus citations: 17
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  18. Published

    Improving Fault-Localization Accuracy by Referencing Debugging History to Alleviate Structure Bias in Code Suspiciousness

    Zhang, L., Li, Z., Feng, Y., Zhang, Z., Chan, W. K., Zhang, J. & Zhou, Y., Sep 2020, In: IEEE Transactions on Reliability. 69, 3, p. 1021-1049 9082019.

    Research output: Journal Publications and Reviews (RGC: 21, 22, 62) › 21_Publication in refereed journal › peer-review

    Scopus citations: 5
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  19. Published

    Improving Ranking-Oriented Defect Prediction Using a Cost-Sensitive Ranking SVM

    Yu, X., Liu, J., Keung, J. W., Li, Q., Bennin, K. E., Xu, Z., Wang, J., & 1 othersCui, X., Mar 2020, In: IEEE Transactions on Reliability. 69, 1, p. 139-153

    Research output: Journal Publications and Reviews (RGC: 21, 22, 62) › 21_Publication in refereed journal › peer-review

    Scopus citations: 23
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  20. Published

    Process Variation Aware Read Performance Improvement for LDPC-Based nand Flash Memory

    Li, Q., Shi, L., Di, Y., Gao, C., Ji, C., Liang, Y. & Xue, C. J., Mar 2020, In: IEEE Transactions on Reliability. 69, 1, p. 310-321

    Research output: Journal Publications and Reviews (RGC: 21, 22, 62) › 21_Publication in refereed journal › peer-review

    Scopus citations: 11
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  21. 2019
  22. Published

    A Systematic Study on Factors Impacting GUI Traversal-Based Test Case Generation Techniques for Android Applications

    Jiang, B., Zhang, Y., Chan, W. K. & Zhang, Z., Sep 2019, In: IEEE Transactions on Reliability. 68, 3, p. 913-926

    Research output: Journal Publications and Reviews (RGC: 21, 22, 62) › 21_Publication in refereed journal › peer-review

    Scopus citations: 3
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  23. Published

    Dynamic Random Testing: Technique and Experimental Evaluation

    Pei, H., Cai, K., Yin, B., Mathur, A. P. & Xie, M., Sep 2019, In: IEEE Transactions on Reliability. 68, 3, p. 872-892

    Research output: Journal Publications and Reviews (RGC: 21, 22, 62) › 21_Publication in refereed journal › peer-review

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  24. Published

    Fast Semiconductor Reliability Assessments Using SPRT

    Chien, W. K., Chung, A. & Kuo, W., Jun 2019, In: IEEE Transactions on Reliability. 68, 2, p. 526-538

    Research output: Journal Publications and Reviews (RGC: 21, 22, 62) › 21_Publication in refereed journal › peer-review

    Scopus citations: 3
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  25. 2018
  26. Published

    HistLock+: Precise Memory Access Maintenance Without Lockset Comparison for Complete Hybrid Data Race Detection

    Yang, J., Jiang, B. & Chan, W. K., Sep 2018, In: IEEE Transactions on Reliability. 67, 3, p. 786-801

    Research output: Journal Publications and Reviews (RGC: 21, 22, 62) › 21_Publication in refereed journal › peer-review

    Scopus citations: 8
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