IEEE Transactions on Reliability
IEEE Transactions on Reliability
ISSNs: 0018-9529, 0097-4552, 2168-2771, 2168-2755
Additional searchable ISSN (Electronic): 1558-1721, 2168-2801, 2168-2798, 2168-2763
Institute of Electrical and Electronics Engineers, United States
Scopus (2020), Scopus (2020), Scopus rating (2021)
Journal
Research Output
- 2020
- Published
Imperfect Preventive Maintenance Policies With Unpunctual Execution
Wang, X., Zhou, H., Parlikad, A. K. & Xie, M., Dec 2020, In : IEEE Transactions on Reliability. 69, 4, p. 1480-1492 13 p., 9069302.Research output: Journal Publications and Reviews (RGC: 21, 22, 62) › 21_Publication in refereed journal › peer-review
Scopus citations: 4 - Published
Guest Editorial: Crisis Management - From Nuclear Accidents to Outbreaks of COVID-19 and Infectious Diseases
Kuo, W. & He, J., Sep 2020, In : IEEE Transactions on Reliability. 69, 3, p. 846-850 9181848.Research output: Journal Publications and Reviews (RGC: 21, 22, 62) › Editorial Preface
- Published
Improving Fault-Localization Accuracy by Referencing Debugging History to Alleviate Structure Bias in Code Suspiciousness
Zhang, L., Li, Z., Feng, Y., Zhang, Z., Chan, W. K., Zhang, J. & Zhou, Y., Sep 2020, In : IEEE Transactions on Reliability. 69, 3, p. 1021-1049 9082019.Research output: Journal Publications and Reviews (RGC: 21, 22, 62) › 21_Publication in refereed journal › peer-review
- Published
Improving Ranking-Oriented Defect Prediction Using a Cost-Sensitive Ranking SVM
Yu, X., Liu, J., Keung, J. W., Li, Q., Bennin, K. E., Xu, Z., Wang, J. & 1 others, , Mar 2020, In : IEEE Transactions on Reliability. 69, 1, p. 139-153Research output: Journal Publications and Reviews (RGC: 21, 22, 62) › 21_Publication in refereed journal › peer-review
Scopus citations: 2 - Published
Process Variation Aware Read Performance Improvement for LDPC-Based nand Flash Memory
Li, Q., Shi, L., Di, Y., Gao, C., Ji, C., Liang, Y. & Xue, C. J., Mar 2020, In : IEEE Transactions on Reliability. 69, 1, p. 310-321Research output: Journal Publications and Reviews (RGC: 21, 22, 62) › 21_Publication in refereed journal › peer-review
Scopus citations: 2 - 2019
- Published
A Systematic Study on Factors Impacting GUI Traversal-Based Test Case Generation Techniques for Android Applications
Jiang, B., Zhang, Y., Chan, W. K. & Zhang, Z., Sep 2019, In : IEEE Transactions on Reliability. 68, 3, p. 913-926Research output: Journal Publications and Reviews (RGC: 21, 22, 62) › 21_Publication in refereed journal › peer-review
- Published
Dynamic Random Testing: Technique and Experimental Evaluation
Pei, H., Cai, K., Yin, B., Mathur, A. P. & Xie, M., Sep 2019, In : IEEE Transactions on Reliability. 68, 3, p. 872-892Research output: Journal Publications and Reviews (RGC: 21, 22, 62) › 21_Publication in refereed journal › peer-review
- Published
Fast Semiconductor Reliability Assessments Using SPRT
Chien, W. K., Chung, A. & Kuo, W., Jun 2019, In : IEEE Transactions on Reliability. 68, 2, p. 526-538Research output: Journal Publications and Reviews (RGC: 21, 22, 62) › 21_Publication in refereed journal › peer-review
- 2018
- Published
Investigating the Significance of the Bellwether Effect to Improve Software Effort Prediction: Further Empirical Study
Mensah, S., Keung, J., MacDonell, S. G., Bosu, M. F. & Bennin, K. E., Sep 2018, In : IEEE Transactions on Reliability. 67, 3, p. 1176-1198Research output: Journal Publications and Reviews (RGC: 21, 22, 62) › 21_Publication in refereed journal › peer-review
Scopus citations: 4 - Published
Reliability Modeling and Analysis of Load-Sharing Systems With Continuously Degrading Components
Zhao, X., Liu, B. & Liu, Y., Sep 2018, In : IEEE Transactions on Reliability. 67, 3, p. 1096-1110Research output: Journal Publications and Reviews (RGC: 21, 22, 62) › 21_Publication in refereed journal › peer-review
Scopus citations: 26 - Published
HistLock+: Precise Memory Access Maintenance Without Lockset Comparison for Complete Hybrid Data Race Detection
Yang, J., Jiang, B. & Chan, W. K., 6 Aug 2018, In : IEEE Transactions on Reliability. 67, 3, p. 786-801Research output: Journal Publications and Reviews (RGC: 21, 22, 62) › 21_Publication in refereed journal › peer-review
Scopus citations: 4 - Published
Accelerated Degradation Tests Planning with Competing Failure Modes
Zhao, X., Xu, J. & Liu, B., Mar 2018, In : IEEE Transactions on Reliability. 67, 1, p. 142-155Research output: Journal Publications and Reviews (RGC: 21, 22, 62) › 21_Publication in refereed journal › peer-review
Scopus citations: 24 - 2017
- Published
Maintenance Scheduling for Multicomponent Systems with Hidden Failures
Liu, B., Yeh, R., Xie, M. & Kuo, W., Dec 2017, In : IEEE Transactions on Reliability. 66, 4, p. 1280-1292Research output: Journal Publications and Reviews (RGC: 21, 22, 62) › 21_Publication in refereed journal › peer-review
Scopus citations: 23 - Published
Preventive Maintenance Models Based on the Generalized Geometric Process
Wang, G., Zhang, Y. & Yam, R. C. M., Dec 2017, In : IEEE Transactions on Reliability. 66, 4, p. 1380-1388Research output: Journal Publications and Reviews (RGC: 21, 22, 62) › 21_Publication in refereed journal › peer-review
Scopus citations: 7 - Published
Statistical Modeling of Bearing Degradation Signals
Wang, D. & Tsui, K., Dec 2017, In : IEEE Transactions on Reliability. 66, 4, p. 1331-1344Research output: Journal Publications and Reviews (RGC: 21, 22, 62) › 21_Publication in refereed journal › peer-review
Scopus citations: 36 - Published
Accuracy Graphs of Spectrum-Based Fault Localization Formulas
Tang, C. M., Chan, W. K., Yu, Y. T. & Zhang, Z., Jun 2017, In : IEEE Transactions on Reliability. 66, 2, p. 403-424 2688487.Research output: Journal Publications and Reviews (RGC: 21, 22, 62) › 21_Publication in refereed journal › peer-review
Scopus citations: 16 - 2016
- Published
To What Extent is Stress Testing of Android TV Applications Automated in Industrial Environments?
Jiang, B., Chen, P., Chan, W. K. & Zhang, X., 1 Sep 2016, In : IEEE Transactions on Reliability. 65, 3, p. 1223-1239 7298477.Research output: Journal Publications and Reviews (RGC: 21, 22, 62) › 21_Publication in refereed journal › peer-review
Scopus citations: 5 - Published
Optimal Cable Laying Across an Earthquake Fault Line Considering Elliptical Failures
Cao, C., Wang, Z., Zukerman, M., Manton, J. H., Bensoussan, A. & Wang, Y., Sep 2016, In : IEEE Transactions on Reliability. 65, 3, p. 1536-1550Research output: Journal Publications and Reviews (RGC: 21, 22, 62) › 21_Publication in refereed journal › peer-review
Scopus citations: 7 - Published
Optimal Design for Destructive Degradation Tests with Random Initial Degradation Values Using the Wiener Process
Xiao, X. & Ye, Z., Sep 2016, In : IEEE Transactions on Reliability. 65, 3, p. 1327-1342 7497478.Research output: Journal Publications and Reviews (RGC: 21, 22, 62) › 21_Publication in refereed journal › peer-review
Scopus citations: 27 - 2015
- Published
Reflections on Reliability: Key Events 1999-2015
Kuo, W., 1 Sep 2015, In : IEEE Transactions on Reliability. 64, 3, p. 838-839 7163369.Research output: Journal Publications and Reviews (RGC: 21, 22, 62) › Editorial Preface