IEEE Transactions on Reliability
IEEE Transactions on Reliability
ISSNs: 0018-9529, 0097-4552, 2168-2771, 2168-2755
Additional searchable ISSN (Electronic): 1558-1721, 2168-2801, 2168-2798, 2168-2763
Institute of Electrical and Electronics Engineers, United States
Scopus rating (2017): CiteScore 3.49 SJR 1.444 SNIP 1.986
Journal
Research Output
- 2018
- E-pub ahead of print
Fast Semiconductor Reliability Assessments Using SPRT
Chien, W. K., Chung, A. & Kuo, W., 18 Oct 2018, In : IEEE Transactions on Reliability.Research output: Journal Publications and Reviews (RGC: 21, 22, 62) › 21_Publication in refereed journal › Not applicable › peer-review
- Published
Investigating the Significance of the Bellwether Effect to Improve Software Effort Prediction: Further Empirical Study
Mensah, S., Keung, J., MacDonell, S. G., Bosu, M. F. & Bennin, K. E., Sep 2018, In : IEEE Transactions on Reliability. 67, 3, p. 1176-1198Research output: Journal Publications and Reviews (RGC: 21, 22, 62) › 21_Publication in refereed journal › Not applicable › peer-review
Scopus citations: 1 - Published
Reliability Modeling and Analysis of Load-Sharing Systems With Continuously Degrading Components
Zhao, X., Liu, B. & Liu, Y., Sep 2018, In : IEEE Transactions on Reliability. 67, 3, p. 1096-1110Research output: Journal Publications and Reviews (RGC: 21, 22, 62) › 21_Publication in refereed journal › Not applicable › peer-review
Scopus citations: 2 - Published
HistLock+: Precise Memory Access Maintenance Without Lockset Comparison for Complete Hybrid Data Race Detection
Yang, J., Jiang, B. & Chan, W. K., 6 Aug 2018, In : IEEE Transactions on Reliability. 67, 3, p. 786-801Research output: Journal Publications and Reviews (RGC: 21, 22, 62) › 21_Publication in refereed journal › Not applicable › peer-review
- Published
Accelerated Degradation Tests Planning with Competing Failure Modes
Zhao, X., Xu, J. & Liu, B., Mar 2018, In : IEEE Transactions on Reliability. 67, 1, p. 142-155Research output: Journal Publications and Reviews (RGC: 21, 22, 62) › 21_Publication in refereed journal › Not applicable › peer-review
Scopus citations: 5 - 2017
- Published
Maintenance Scheduling for Multicomponent Systems with Hidden Failures
Liu, B., Yeh, R., Xie, M. & Kuo, W., Dec 2017, In : IEEE Transactions on Reliability. 66, 4, p. 1280-1292Research output: Journal Publications and Reviews (RGC: 21, 22, 62) › 21_Publication in refereed journal › Not applicable › peer-review
Scopus citations: 3 - Published
Preventive Maintenance Models Based on the Generalized Geometric Process
Wang, G., Zhang, Y. & Yam, R. C. M., Dec 2017, In : IEEE Transactions on Reliability. 66, 4, p. 1380-1388Research output: Journal Publications and Reviews (RGC: 21, 22, 62) › 21_Publication in refereed journal › Not applicable › peer-review
Scopus citations: 1 - Published
Statistical Modeling of Bearing Degradation Signals
Wang, D. & Tsui, K., Dec 2017, In : IEEE Transactions on Reliability. 66, 4, p. 1331-1344Research output: Journal Publications and Reviews (RGC: 21, 22, 62) › 21_Publication in refereed journal › Not applicable › peer-review
Scopus citations: 11 - Published
Accuracy Graphs of Spectrum-Based Fault Localization Formulas
Tang, C. M., Chan, W. K., Yu, Y. T. & Zhang, Z., 1 Jun 2017, In : IEEE Transactions on Reliability. 66, 2, p. 403-424 2688487Research output: Journal Publications and Reviews (RGC: 21, 22, 62) › 21_Publication in refereed journal › Not applicable › peer-review
Scopus citations: 10 - 2016
- Published
Optimal Design for Destructive Degradation Tests with Random Initial Degradation Values Using the Wiener Process
Xiao, X. & Ye, Z., 1 Sep 2016, In : IEEE Transactions on Reliability. 65, 3, p. 1327-1342 7497478Research output: Journal Publications and Reviews (RGC: 21, 22, 62) › 21_Publication in refereed journal › Not applicable › peer-review
Scopus citations: 13 - Published
To What Extent is Stress Testing of Android TV Applications Automated in Industrial Environments?
Jiang, B., Chen, P., Chan, W. K. & Zhang, X., 1 Sep 2016, In : IEEE Transactions on Reliability. 65, 3, p. 1223-1239 7298477Research output: Journal Publications and Reviews (RGC: 21, 22, 62) › 21_Publication in refereed journal › Not applicable › peer-review
Scopus citations: 3 - Published
Optimal Cable Laying Across an Earthquake Fault Line Considering Elliptical Failures
Cao, C., Wang, Z., Zukerman, M., Manton, J. H., Bensoussan, A. & Wang, Y., Sep 2016, In : IEEE Transactions on Reliability. 65, 3, p. 1536-1550Research output: Journal Publications and Reviews (RGC: 21, 22, 62) › 21_Publication in refereed journal › Not applicable › peer-review
Scopus citations: 3 - 2015
- Published
Reflections on Reliability: Key Events 1999-2015
Kuo, W., 1 Sep 2015, In : IEEE Transactions on Reliability. 64, 3, p. 838-839 7163369Research output: Journal Publications and Reviews (RGC: 21, 22, 62) › Editorial Preface › Not applicable
- Published
Accelerated degradation analysis for the quality of a system based on the gamma process
Ling, M. H., Tsui, K. L. & Balakrishnan, N., 1 Mar 2015, In : IEEE Transactions on Reliability. 64, 1, p. 463-472 6860326Research output: Journal Publications and Reviews (RGC: 21, 22, 62) › 21_Publication in refereed journal › Not applicable › peer-review
Scopus citations: 38 - Published
Risk and reliability are part of our life
Kuo, W., 2015, In : IEEE Transactions on Reliability. 64, 1, p. 2-3 7051316Research output: Journal Publications and Reviews (RGC: 21, 22, 62) › 21_Publication in refereed journal › Not applicable › peer-review
- 2014
Accelerated degradation test planning using the inverse gaussian process
Ye, Z., Chen, L., Tang, L. C. & Xie, M., Sep 2014, In : IEEE Transactions on Reliability. 63, 3, p. 750-763 6786428Research output: Journal Publications and Reviews (RGC: 21, 22, 62) › 21_Publication in refereed journal › Not applicable › peer-review
Scopus citations: 63- 2013
- Published
A bivariate maintenance policy for multi-state repairable systems with monotone process
Zhang, M., Xie, M. & Gaudoin, O., Dec 2013, In : IEEE Transactions on Reliability. 62, 4, p. 876-886 6634272Research output: Journal Publications and Reviews (RGC: 21, 22, 62) › 21_Publication in refereed journal › Not applicable › peer-review
Scopus citations: 14 - Published
Degradation data analysis using wiener processes with measurement errors
Ye, Z., Wang, Y., Tsui, K. & Pecht, M., Dec 2013, In : IEEE Transactions on Reliability. 62, 4, p. 772-780 6632957Research output: Journal Publications and Reviews (RGC: 21, 22, 62) › 21_Publication in refereed journal › Not applicable › peer-review
Scopus citations: 133 - Published
A bayesian approach for system reliability analysis with multilevel pass-fail, lifetime and degradation data sets
Peng, W., Huang, H., Xie, M., Yang, Y. & Liu, Y., 2013, In : IEEE Transactions on Reliability. 62, 3, p. 689-699 6550896Research output: Journal Publications and Reviews (RGC: 21, 22, 62) › 21_Publication in refereed journal › Not applicable › peer-review
Scopus citations: 32 - Published
Evaluation and comparison of mixed effects model based prognosis for hard failure
Son, J., Zhou, Q., Zhou, S., Mao, X. & Salman, M., 2013, In : IEEE Transactions on Reliability. 62, 2, p. 379-394 6509984Research output: Journal Publications and Reviews (RGC: 21, 22, 62) › 21_Publication in refereed journal › Not applicable › peer-review
Scopus citations: 28