IEEE Transactions on Reliability

IEEE Transactions on Reliability

ISSNs: 0018-9529, 0097-4552, 2168-2771, 2168-2755

Additional searchable ISSN (Electronic): 1558-1721, 2168-2801, 2168-2798, 2168-2763

Institute of Electrical and Electronics Engineers, United States

Scopus (2020), Scopus (2020), Scopus rating (2021)

Journal

Journal Metrics

Research Output

  1. 2020
  2. Published

    Imperfect Preventive Maintenance Policies With Unpunctual Execution

    Wang, X., Zhou, H., Parlikad, A. K. & Xie, M., Dec 2020, In : IEEE Transactions on Reliability. 69, 4, p. 1480-1492 13 p., 9069302.

    Research output: Journal Publications and Reviews (RGC: 21, 22, 62)21_Publication in refereed journalpeer-review

    Scopus citations: 4
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  3. Published

    Guest Editorial: Crisis Management - From Nuclear Accidents to Outbreaks of COVID-19 and Infectious Diseases

    Kuo, W. & He, J., Sep 2020, In : IEEE Transactions on Reliability. 69, 3, p. 846-850 9181848.

    Research output: Journal Publications and Reviews (RGC: 21, 22, 62)Editorial Preface

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  4. Published

    Improving Fault-Localization Accuracy by Referencing Debugging History to Alleviate Structure Bias in Code Suspiciousness

    Zhang, L., Li, Z., Feng, Y., Zhang, Z., Chan, W. K., Zhang, J. & Zhou, Y., Sep 2020, In : IEEE Transactions on Reliability. 69, 3, p. 1021-1049 9082019.

    Research output: Journal Publications and Reviews (RGC: 21, 22, 62)21_Publication in refereed journalpeer-review

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  5. Published

    Improving Ranking-Oriented Defect Prediction Using a Cost-Sensitive Ranking SVM

    Yu, X., Liu, J., Keung, J. W., Li, Q., Bennin, K. E., Xu, Z., Wang, J. & 1 others, Cui, X., Mar 2020, In : IEEE Transactions on Reliability. 69, 1, p. 139-153

    Research output: Journal Publications and Reviews (RGC: 21, 22, 62)21_Publication in refereed journalpeer-review

    Scopus citations: 2
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  6. Published

    Process Variation Aware Read Performance Improvement for LDPC-Based nand Flash Memory

    Li, Q., Shi, L., Di, Y., Gao, C., Ji, C., Liang, Y. & Xue, C. J., Mar 2020, In : IEEE Transactions on Reliability. 69, 1, p. 310-321

    Research output: Journal Publications and Reviews (RGC: 21, 22, 62)21_Publication in refereed journalpeer-review

    Scopus citations: 2
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  7. 2019
  8. Published

    A Systematic Study on Factors Impacting GUI Traversal-Based Test Case Generation Techniques for Android Applications

    Jiang, B., Zhang, Y., Chan, W. K. & Zhang, Z., Sep 2019, In : IEEE Transactions on Reliability. 68, 3, p. 913-926

    Research output: Journal Publications and Reviews (RGC: 21, 22, 62)21_Publication in refereed journalpeer-review

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  9. Published

    Dynamic Random Testing: Technique and Experimental Evaluation

    Pei, H., Cai, K., Yin, B., Mathur, A. P. & Xie, M., Sep 2019, In : IEEE Transactions on Reliability. 68, 3, p. 872-892

    Research output: Journal Publications and Reviews (RGC: 21, 22, 62)21_Publication in refereed journalpeer-review

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  10. Published

    Fast Semiconductor Reliability Assessments Using SPRT

    Chien, W. K., Chung, A. & Kuo, W., Jun 2019, In : IEEE Transactions on Reliability. 68, 2, p. 526-538

    Research output: Journal Publications and Reviews (RGC: 21, 22, 62)21_Publication in refereed journalpeer-review

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  11. 2018
  12. Published

    Investigating the Significance of the Bellwether Effect to Improve Software Effort Prediction: Further Empirical Study

    Mensah, S., Keung, J., MacDonell, S. G., Bosu, M. F. & Bennin, K. E., Sep 2018, In : IEEE Transactions on Reliability. 67, 3, p. 1176-1198

    Research output: Journal Publications and Reviews (RGC: 21, 22, 62)21_Publication in refereed journalpeer-review

    Scopus citations: 4
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  13. Published

    Reliability Modeling and Analysis of Load-Sharing Systems With Continuously Degrading Components

    Zhao, X., Liu, B. & Liu, Y., Sep 2018, In : IEEE Transactions on Reliability. 67, 3, p. 1096-1110

    Research output: Journal Publications and Reviews (RGC: 21, 22, 62)21_Publication in refereed journalpeer-review

    Scopus citations: 26
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  14. Published

    HistLock+: Precise Memory Access Maintenance Without Lockset Comparison for Complete Hybrid Data Race Detection

    Yang, J., Jiang, B. & Chan, W. K., 6 Aug 2018, In : IEEE Transactions on Reliability. 67, 3, p. 786-801

    Research output: Journal Publications and Reviews (RGC: 21, 22, 62)21_Publication in refereed journalpeer-review

    Scopus citations: 4
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  15. Published

    Accelerated Degradation Tests Planning with Competing Failure Modes

    Zhao, X., Xu, J. & Liu, B., Mar 2018, In : IEEE Transactions on Reliability. 67, 1, p. 142-155

    Research output: Journal Publications and Reviews (RGC: 21, 22, 62)21_Publication in refereed journalpeer-review

    Scopus citations: 24
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  16. 2017
  17. Published

    Maintenance Scheduling for Multicomponent Systems with Hidden Failures

    Liu, B., Yeh, R., Xie, M. & Kuo, W., Dec 2017, In : IEEE Transactions on Reliability. 66, 4, p. 1280-1292

    Research output: Journal Publications and Reviews (RGC: 21, 22, 62)21_Publication in refereed journalpeer-review

    Scopus citations: 23
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  18. Published

    Preventive Maintenance Models Based on the Generalized Geometric Process

    Wang, G., Zhang, Y. & Yam, R. C. M., Dec 2017, In : IEEE Transactions on Reliability. 66, 4, p. 1380-1388

    Research output: Journal Publications and Reviews (RGC: 21, 22, 62)21_Publication in refereed journalpeer-review

    Scopus citations: 7
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  19. Published

    Statistical Modeling of Bearing Degradation Signals

    Wang, D. & Tsui, K., Dec 2017, In : IEEE Transactions on Reliability. 66, 4, p. 1331-1344

    Research output: Journal Publications and Reviews (RGC: 21, 22, 62)21_Publication in refereed journalpeer-review

    Scopus citations: 36
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  20. Published

    Accuracy Graphs of Spectrum-Based Fault Localization Formulas

    Tang, C. M., Chan, W. K., Yu, Y. T. & Zhang, Z., Jun 2017, In : IEEE Transactions on Reliability. 66, 2, p. 403-424 2688487.

    Research output: Journal Publications and Reviews (RGC: 21, 22, 62)21_Publication in refereed journalpeer-review

    Scopus citations: 16
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  21. 2016
  22. Published

    To What Extent is Stress Testing of Android TV Applications Automated in Industrial Environments?

    Jiang, B., Chen, P., Chan, W. K. & Zhang, X., 1 Sep 2016, In : IEEE Transactions on Reliability. 65, 3, p. 1223-1239 7298477.

    Research output: Journal Publications and Reviews (RGC: 21, 22, 62)21_Publication in refereed journalpeer-review

    Scopus citations: 5
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  23. Published

    Optimal Cable Laying Across an Earthquake Fault Line Considering Elliptical Failures

    Cao, C., Wang, Z., Zukerman, M., Manton, J. H., Bensoussan, A. & Wang, Y., Sep 2016, In : IEEE Transactions on Reliability. 65, 3, p. 1536-1550

    Research output: Journal Publications and Reviews (RGC: 21, 22, 62)21_Publication in refereed journalpeer-review

    Scopus citations: 7
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  24. Published

    Optimal Design for Destructive Degradation Tests with Random Initial Degradation Values Using the Wiener Process

    Xiao, X. & Ye, Z., Sep 2016, In : IEEE Transactions on Reliability. 65, 3, p. 1327-1342 7497478.

    Research output: Journal Publications and Reviews (RGC: 21, 22, 62)21_Publication in refereed journalpeer-review

    Scopus citations: 27
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  25. 2015
  26. Published

    Reflections on Reliability: Key Events 1999-2015

    Kuo, W., 1 Sep 2015, In : IEEE Transactions on Reliability. 64, 3, p. 838-839 7163369.

    Research output: Journal Publications and Reviews (RGC: 21, 22, 62)Editorial Preface

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