IEEE Transactions on Electronics Packaging Manufacturing
IEEE Transactions on Electronics Packaging Manufacturing
ISSNs: 1521-334X
Institute of Electrical and Electronics Engineers Inc., United States
Journal
Research Output
- 2010
- Published
Electrical shorting propensity of tin whiskers
Han, S., Osterman, M. & Pecht, M. G., Jul 2010, In: IEEE Transactions on Electronics Packaging Manufacturing. 33, 3, p. 205-211 5524096.Research output: Journal Publications and Reviews (RGC: 21, 22, 62) › 22_Publication in policy or professional journal
Scopus citations: 7 - Published
Comparison of Printed Circuit Board Property Variations in Response to Simulated Lead-Free Soldering
Sood, B., Sanapala, R., Das, D., Pecht, M., Huang, C. Y. & Tsai, M. Y., 2010, In: IEEE Transactions on Electronics Packaging Manufacturing. 33, 2, p. 98 - 111Research output: Journal Publications and Reviews (RGC: 21, 22, 62) › 22_Publication in policy or professional journal
Scopus citations: 13 - 2009
- Published
Effect of Lead-Free Soldering on Key Material Properties of FR-4 Printed Circuit Board Laminates
Sanapala, R., Sood, B., Das, D. & PECHT, M., 2009, In: IEEE Transactions on Electronics Packaging Manufacturing. 32, 4, p. 272 - 280Research output: Journal Publications and Reviews (RGC: 21, 22, 62) › 22_Publication in policy or professional journal
- 2008
Automatic microassembly using visual servo control
Wang, L., Mills, J. K. & Cleghorn, W. L., 2008, In: IEEE Transactions on Electronics Packaging Manufacturing. 31, 4, p. 316-325Research output: Journal Publications and Reviews (RGC: 21, 22, 62) › 22_Publication in policy or professional journal
Scopus citations: 51- 2005
A General Weibull Model for Reliability Analysis Under Different Failure Criteria - Application on Anisotropic Conductive Adhesive Joining Technology
Liu, J., Cao, L., Xie, M., Goh, T. & Tang, Y., Oct 2005, In: IEEE Transactions on Electronics Packaging Manufacturing. 28, 4, p. 322-327Research output: Journal Publications and Reviews (RGC: 21, 22, 62) › 22_Publication in policy or professional journal
Scopus citations: 8- 2004
- Published
Effects of solder reflow on the reliability of flip-chip on flex interconnections using anisotropic conductive adhesives
Yin, C., Lu, H., Bailey, C. & Chan, Y., Oct 2004, In: IEEE Transactions on Electronics Packaging Manufacturing. 27, 4, p. 254-259Research output: Journal Publications and Reviews (RGC: 21, 22, 62) › 21_Publication in refereed journal › peer-review
Scopus citations: 33 Foreword to the special section of the Asian Green Electronics Conference (AGEC)
Liu, J., Griese, H. J. & Chan, Y., Oct 2004, In: IEEE Transactions on Electronics Packaging Manufacturing. 27, 4, p. 213-214Research output: Journal Publications and Reviews (RGC: 21, 22, 62) › Editorial Preface
Scopus citations: 1- Published
Model-based integration of control and supervision for one kind of curing process
Li, H., Deng, H. & Zhong, J., Jul 2004, In: IEEE Transactions on Electronics Packaging Manufacturing. 27, 3, p. 177-186Research output: Journal Publications and Reviews (RGC: 21, 22, 62) › 22_Publication in policy or professional journal
Scopus citations: 38 - 2003
- Published
Comparative study of fluid dispensing modeling
Hong, Y. & Li, H., Oct 2003, In: IEEE Transactions on Electronics Packaging Manufacturing. 26, 4, p. 273-280Research output: Journal Publications and Reviews (RGC: 21, 22, 62) › 22_Publication in policy or professional journal
Scopus citations: 53 - 2001
Neural network modeling with confidence bounds: A case study on the solder paste deposition process
Ho, S. L., Xie, M., Tang, L. C., Xu, K. & Goh, T. N., Oct 2001, In: IEEE Transactions on Electronics Packaging Manufacturing. 24, 4, p. 323-332Research output: Journal Publications and Reviews (RGC: 21, 22, 62) › 22_Publication in policy or professional journal
Scopus citations: 32- 2000
Burn-in effect on yield
Kim, T., Kuo, W. & Chien, W. K., Oct 2000, In: IEEE Transactions on Electronics Packaging Manufacturing. 23, 4, p. 236Research output: Journal Publications and Reviews (RGC: 21, 22, 62) › Meeting abstract › peer-review
Burn-In Effect on Yield
Kim, T., Kuo, W. & Chien, W. K., Oct 2000, In: IEEE Transactions on Electronics Packaging Manufacturing. 23, 4, p. 293-299Research output: Journal Publications and Reviews (RGC: 21, 22, 62) › 22_Publication in policy or professional journal
Scopus citations: 12