IEEE Journal of the Electron Devices Society

IEEE Journal of the Electron Devices Society

ISSNs: 2168-6734

Institute of Electrical and Electronics Engineers Inc.

Scopus rating (2021): CiteScore 4.7 SJR 0.574 SNIP 1.104

Indexed in DOAJ

Journal

Journal Metrics

Research Output

  1. 2016
  2. Published

    Phase Noise Reduction in a VHF MEMS-CMOS Oscillator Using Phononic Crystals

    Qin, P., Zhu, H., Lee, J. E. & Xue, Q., 1 May 2016, In: IEEE Journal of the Electron Devices Society. 4, 3, p. 149-154 7400895.

    Research output: Journal Publications and Reviews (RGC: 21, 22, 62)21_Publication in refereed journalpeer-review

    Scopus citations: 11
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