IEEE Electron Device Letters

IEEE Electron Device Letters

ISSNs: 0741-3106, 0193-8576

Additional searchable ISSN (electronic): 1558-0563

Institute of Electrical and Electronics Engineers, United States

Scopus rating (2023): CiteScore 8.2 SJR 1.25 SNIP 1.5

Journal

Journal Metrics
1 - 13 out of 13Page size: 20

Research Output

  1. 2018

  2. Body Effects on the Tuning RF Performance of PD SOI Technology Using Four-Port Network

    Lu, K., Dong, Y., Yang, W. & Guo, Y., 1 Jun 2018, In: IEEE Electron Device Letters. 39, 6, p. 795-798

    Research output: Journal Publications and Reviews › RGC 21 - Publication in refereed journal › peer-review

    Scopus citations: 5
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  3. 2017

  4. Device Process and Circuit Application Interaction for Harsh Electronics: Hf-In-Zn-O Thin Film Transistors as an Example

    Ho, C.-H., Tsai, D.-S., Lu, C., Kim, S. Y., Mungan, S., Yang, S.-G. & Zhang, Y. & 1 others, He, J.-H., Aug 2017, In: IEEE Electron Device Letters. 38, 8, p. 1039-1042 7959154.

    Research output: Journal Publications and Reviews › RGC 21 - Publication in refereed journal › peer-review

    Scopus citations: 12
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  5. 2015

  6. Galvanic Effect of Au-Ag Electrodes for Conductive Bridging Resistive Switching Memory

    Kuo, C. C., Chen, I. C., Shih, C. C., Chang, K. C., Huang, C. H., Chen, P. H. & Chang, T.-C. & 3 others, Tsai, T. M., Chang, J. S. & Huang, J. C., Dec 2015, In: IEEE Electron Device Letters. 36, 12, p. 1321-1324 7312919.

    Research output: Journal Publications and Reviews › RGC 21 - Publication in refereed journal › peer-review

    Scopus citations: 34
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  7. Surface-Controlled Metal Oxide Resistive Memory

    Ke, J.-J., Namura, K., Retamal, J. R. D., Ho, C.-H., Minamitake, H., Wei, T.-C. & Tsai, D.-S. & 3 others, Lin, C.-H., Suzuki, M. & He, J.-H., Dec 2015, In: IEEE Electron Device Letters. 36, 12, p. 1307-1309 7310859.

    Research output: Journal Publications and Reviews › RGC 21 - Publication in refereed journal › peer-review

    Scopus citations: 13
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  8. 2012

  9. 4H-SiC Metal-Semiconductor-Metal Ultraviolet Photodetectors in Operation of 450 °c

    Lien, W.-C., Tsai, D.-S., Lien, D.-H., Senesky, D. G., He, J.-H. & Pisano, A. P., Nov 2012, In: IEEE Electron Device Letters. 33, 11, p. 1586-1588 6329395.

    Research output: Journal Publications and Reviews › RGC 21 - Publication in refereed journal › peer-review

    Scopus citations: 81
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  10. Photocarrier Relaxation Behavior of a Single ZnO Nanowire UV Photodetector: Effect of Surface Band Bending

    Chen, M.-W., Retamal, J. R. D., Chen, C.-Y. & He, J.-H., Mar 2012, In: IEEE Electron Device Letters. 33, 3, p. 411-413 6144690.

    Research output: Journal Publications and Reviews › RGC 21 - Publication in refereed journal › peer-review

    Scopus citations: 57
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  11. 2011

  12. Low-Temperature, Ion Beam-Assisted SiC Thin Films With Antireflective ZnO Nanorod Arrays for High-Temperature Photodetection

    Lien, W.-C., Tsai, D.-S., Chiu, S.-H., Senesky, D. G., Maboudian, R., Pisano, A. P. & He, J.-H., Nov 2011, In: IEEE Electron Device Letters. 32, 11, p. 1564-1566 6022746.

    Research output: Journal Publications and Reviews › RGC 21 - Publication in refereed journal › peer-review

    Scopus citations: 36
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  13. Efficiency enhancement of InGaN-based multiple quantum well solar cells employing antireflective ZnO nanorod arrays

    Lin, G. J., Lai, K. Y., Lin, C. A., Lai, Y.-L. & He, J. H., Aug 2011, In: IEEE Electron Device Letters. 32, 8, p. 1104-1106 5930323.

    Research output: Journal Publications and Reviews › RGC 21 - Publication in refereed journal › peer-review

    Scopus citations: 27
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  14. Origin of Hot Carriers in InGaN-Based Quantum-Well Solar Cells

    Lai, K. Y., Lin, G. J., Chen, C.-Y., Lai, Y.-L. & He, J. H., Feb 2011, In: IEEE Electron Device Letters. 32, 2, p. 179-181 5671457.

    Research output: Journal Publications and Reviews › RGC 21 - Publication in refereed journal › peer-review

    Scopus citations: 24
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  15. Understanding asymmetric transportation behavior in graphene field-effect transistors using scanning kelvin probe microscopy

    Liu, W. J., Yu, H. Y., Xu, S. H., Zhang, Q., Zou, X., Wang, J. L. & Pey, K. L. & 3 others, Wei, J., Zhu, H. L. & Li, M. F., Feb 2011, In: IEEE Electron Device Letters. 32, 2, p. 128-130 5672574.

    Research output: Journal Publications and Reviews › RGC 21 - Publication in refereed journal › peer-review

    Scopus citations: 13
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  16. 2009

  17. Development of a 60-GHz bandpass filter and a dipole antenna using wafer transfer technology

    Guo, Y.-X., Wang, J., Luo, B. & Liao, E., 2009, In: IEEE Electron Device Letters. 30, 7, p. 784-786

    Research output: Journal Publications and Reviews › RGC 21 - Publication in refereed journal › peer-review

    Scopus citations: 3
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  18. 2008

  19. A single-crystal-silicon bulk-acoustic-mode microresonator oscillator

    Lee, J.E.-Y., Bahreyni, B., Zhu, Y. & Seshia, A. A., Jul 2008, In: IEEE Electron Device Letters. 29, 7, p. 701-703

    Research output: Journal Publications and Reviews › RGC 21 - Publication in refereed journal › peer-review

    Scopus citations: 62
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  20. 1990

  21. Amorphous Carbon Films as Planarization Layers Deposited by Plasma-Enhanced Chemical Vapor Deposition

    Pang, S. W. & Horn, M. W., Sept 1990, In: IEEE Electron Device Letters. 11, 9, p. 391-393

    Research output: Journal Publications and Reviews › RGC 21 - Publication in refereed journal › peer-review

    Scopus citations: 6
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