IEEE Electron Device Letters

IEEE Electron Device Letters

ISSNs: 0741-3106, 0193-8576

Additional searchable ISSN (Electronic): 1558-0563

Institute of Electrical and Electronics Engineers, United States

Scopus (2020), Scopus (2020), Scopus rating (2021)

Journal

Journal Metrics

Research Output

  1. 2020
  2. Published

    Polymer Electret Improves the Performance of the Oxygen-Doped Organic Field-Effect Transistors

    Li, D., Zhu, Y., Wei, P., Lu, W., Li, S., Wang, S., Xu, B. B. & 1 others, Lu, G., Nov 2020, In : IEEE Electron Device Letters. 41, 11, p. 1665-1668 9205215.

    Research output: Journal Publications and Reviews (RGC: 21, 22, 62)21_Publication in refereed journalpeer-review

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  3. Published

    Stable Hysteresis-Free MoS2 Transistors With Low-k/High-k Bilayer Gate Dielectrics

    Zhang, Z., Su, M., Li, G., Wang, J., Zhang, X., Ho, J. C., Wang, C. & 3 others, Wan, D., Liu, X. & Liao, L., Jul 2020, In : IEEE Electron Device Letters. 41, 7, p. 1036-1039

    Research output: Journal Publications and Reviews (RGC: 21, 22, 62)21_Publication in refereed journalpeer-review

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  4. Published

    Equivalent Circuit of Quantum-Dot LED and Acquisition of Carrier Lifetime in Active Layer

    Xiao, H., Wang, K., Wang, R., Chen, W. & Chiang, K. S., Jan 2020, In : IEEE Electron Device Letters. 41, 1, p. 87-90 8907889.

    Research output: Journal Publications and Reviews (RGC: 21, 22, 62)21_Publication in refereed journalpeer-review

    Scopus citations: 2
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  5. 2018
  6. Published

    A Compact and Low-Loss Bandpass Filter Using Self-Coupled Folded-Line Resonator With Capacitive Feeding Technique

    Hou, Z. J., Yang, Y., Zhu, X., Li, Y. C., Dutkiewicz, E. & Xue, Q., Oct 2018, In : IEEE Electron Device Letters. 39, 10, p. 1584-1587

    Research output: Journal Publications and Reviews (RGC: 21, 22, 62)21_Publication in refereed journalpeer-review

    Scopus citations: 10
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  7. Published

    Wideband Millimeter-Wave On-Chip Quadrature Coupler with Improved In-Band Flatness in 0.13-μm SiGe Technology

    Hou, Z. J., Yang, Y., Chiu, L., Zhu, X. & Xue, Q., May 2018, In : IEEE Electron Device Letters. 39, 5, p. 652-655

    Research output: Journal Publications and Reviews (RGC: 21, 22, 62)21_Publication in refereed journalpeer-review

    Scopus citations: 5
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  8. 2017
  9. Published

    Compact On-Chip Bandpass Filter with Improved In-Band Flatness and Stopband Attenuation in 0.13-μm (Bi)-CMOS Technology

    Yang, Y., Liu, H., Hou, Z. J., Zhu, X., Dutkiewicz, E. & Xue, Q., Oct 2017, In : IEEE Electron Device Letters. 38, 10, p. 1359-1362 8010269.

    Research output: Journal Publications and Reviews (RGC: 21, 22, 62)21_Publication in refereed journalpeer-review

    Scopus citations: 32
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  10. Published

    Flexible Low-Power Organic Complementary Inverter Based on Low-k Polymer Dielectric

    Liu, J., Gao, X., Xu, J., Ruotolo, A. & Wang, S., Oct 2017, In : IEEE Electron Device Letters. 38, 10, p. 1461-1464 8004420.

    Research output: Journal Publications and Reviews (RGC: 21, 22, 62)21_Publication in refereed journalpeer-review

    Scopus citations: 2
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  11. Device Process and Circuit Application Interaction for Harsh Electronics: Hf-In-Zn-O Thin Film Transistors as an Example

    Ho, C., Tsai, D., Lu, C., Kim, S. Y., Mungan, S., Yang, S., Zhang, Y. & 1 others, He, J., Aug 2017, In : IEEE Electron Device Letters. 38, 8, p. 1039-1042 7959154.

    Research output: Journal Publications and Reviews (RGC: 21, 22, 62)21_Publication in refereed journalpeer-review

    Scopus citations: 4
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  12. Published

    An On-Chip Bandpass Filter Using a Broadside-Coupled Meander Line Resonator with a Defected-Ground Structure

    Zhong, Y., Yang, Y., Zhu, X., Dutkiewicz, E., Shum, K. M. & Xue, Q., 1 May 2017, In : IEEE Electron Device Letters. 38, 5, p. 626-629 7891020.

    Research output: Journal Publications and Reviews (RGC: 21, 22, 62)21_Publication in refereed journalpeer-review

    Scopus citations: 55
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  13. 2016
  14. Published

    Tungsten-Doped Nb2O5 Nanorod Sensor for Toxic and Combustible Gas Monitoring Applications

    Yu, J., Cheung, K. W., Yan, W. H. & Ho, D., 1 Sep 2016, In : IEEE Electron Device Letters. 37, 9, p. 1223-1226 7506233.

    Research output: Journal Publications and Reviews (RGC: 21, 22, 62)21_Publication in refereed journalpeer-review

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  15. Published

    A broadside-coupled meander-line resonator in 0.13-μm SiGe technology for millimeter-wave application

    Chakraborty, S., Yang, Y., Zhu, X., Sevimli, O., Xue, Q., Esselle, K. & Heimlich, M., 1 Mar 2016, In : IEEE Electron Device Letters. 37, 3, p. 329-332 7390000.

    Research output: Journal Publications and Reviews (RGC: 21, 22, 62)21_Publication in refereed journalpeer-review

    Scopus citations: 59
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  16. 2015
  17. Galvanic Effect of Au-Ag Electrodes for Conductive Bridging Resistive Switching Memory

    Kuo, C. C., Chen, I. C., Shih, C. C., Chang, K. C., Huang, C. H., Chen, P. H., Chang, T. & 3 others, Tsai, T. M., Chang, J. S. & Huang, J. C., Dec 2015, In : IEEE Electron Device Letters. 36, 12, p. 1321-1324 7312919.

    Research output: Journal Publications and Reviews (RGC: 21, 22, 62)21_Publication in refereed journalpeer-review

    Scopus citations: 24
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  18. Surface-Controlled Metal Oxide Resistive Memory

    Ke, J., Namura, K., Retamal, J. R., Ho, C., Minamitake, H., Wei, T., Tsai, D. & 3 others, Lin, C., Suzuki, M. & He, J., Dec 2015, In : IEEE Electron Device Letters. 36, 12, p. 1307-1309 7310859.

    Research output: Journal Publications and Reviews (RGC: 21, 22, 62)21_Publication in refereed journalpeer-review

    Scopus citations: 5
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  19. 2013
  20. Published

    A horseshoe micromachined resonant magnetic field sensor with high quality factor

    Zhang, W. & Lee, J. E., Oct 2013, In : IEEE Electron Device Letters. 34, 10, p. 1310-1312 6595578.

    Research output: Journal Publications and Reviews (RGC: 21, 22, 62)21_Publication in refereed journalpeer-review

    Scopus citations: 18
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  21. Published

    Stability and low-frequency noise in InAs NW parallel-array thin-film transistors

    Wahl, R. E., Wang, F., Chung, H. E., Kunnen, G. R., Yip, S., Lee, E. H., Pun, E. Y. B. & 3 others, Raupp, G. B., Allee, D. R. & Ho, J. C., 2013, In : IEEE Electron Device Letters. 34, 6, p. 765-767 6515612.

    Research output: Journal Publications and Reviews (RGC: 21, 22, 62)21_Publication in refereed journalpeer-review

    Scopus citations: 8
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  22. 2012
  23. 4H-SiC Metal-Semiconductor-Metal Ultraviolet Photodetectors in Operation of 450 °c

    Lien, W., Tsai, D., Lien, D., Senesky, D. G., He, J. & Pisano, A. P., Nov 2012, In : IEEE Electron Device Letters. 33, 11, p. 1586-1588 6329395.

    Research output: Journal Publications and Reviews (RGC: 21, 22, 62)21_Publication in refereed journalpeer-review

    Scopus citations: 48
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  24. Photocarrier Relaxation Behavior of a Single ZnO Nanowire UV Photodetector: Effect of Surface Band Bending

    Chen, M., Retamal, J. R. D., Chen, C. & He, J., Mar 2012, In : IEEE Electron Device Letters. 33, 3, p. 411-413 6144690.

    Research output: Journal Publications and Reviews (RGC: 21, 22, 62)21_Publication in refereed journalpeer-review

    Scopus citations: 47
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  25. Published

    Thermoelastic dissipation in etch-hole filled Lamé bulk-mode silicon microresonators

    Tu, C. & Lee, J. E., Mar 2012, In : IEEE Electron Device Letters. 33, 3, p. 450-452 6144691.

    Research output: Journal Publications and Reviews (RGC: 21, 22, 62)21_Publication in refereed journalpeer-review

    Scopus citations: 12
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  26. Published

    Reversed nonlinear oscillations in lamé-mode single-crystal-silicon microresonators

    Zhu, H. & Lee, J. E., 2012, In : IEEE Electron Device Letters. 33, 10, p. 1492-1494 6291747.

    Research output: Journal Publications and Reviews (RGC: 21, 22, 62)21_Publication in refereed journalpeer-review

    Scopus citations: 7
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  27. 2011
  28. Low-Temperature, Ion Beam-Assisted SiC Thin Films With Antireflective ZnO Nanorod Arrays for High-Temperature Photodetection

    Lien, W., Tsai, D., Chiu, S., Senesky, D. G., Maboudian, R., Pisano, A. P. & He, J., Nov 2011, In : IEEE Electron Device Letters. 32, 11, p. 1564-1566 6022746.

    Research output: Journal Publications and Reviews (RGC: 21, 22, 62)21_Publication in refereed journalpeer-review

    Scopus citations: 30
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