EPJ Applied Physics
EPJ Applied Physics
ISSNs: 1286-0042, 1154-2799
Additional searchable ISSN (electronic): 1286-0050
EDP Sciences, France
Scopus rating (2023): CiteScore 1.9 SJR 0.209 SNIP 0.361
Journal
Research Output
- 2015
Improve the n-type performance in organic heterojunction transistors by controlling thickness of copper phthalocyanine
Zhou, J., Shen, X., Wang, Z., Hu, S., Huang, W., Yu, X. & Gan, P., May 2015, In: EPJ Applied Physics. 70, 2, 20102.Research output: Journal Publications and Reviews › RGC 21 - Publication in refereed journal › peer-review
Scopus citations: 3- 2013
Growth behaviors of ZnO nanostructure on SMAT Cu0.62Zn 0.38 during oxidation
Wang, J. P., Xu, C. H., Zhu, Z. B., Wen, C. S., Lu, J. & Shi, S. Q., May 2013, In: EPJ Applied Physics. 62, 2, 120537.Research output: Journal Publications and Reviews › RGC 21 - Publication in refereed journal › peer-review
Scopus citations: 1Organic field-effect transistors with a sandwich structure from inserting 2,2′,2″-(1,3,5-benzenetriyl)tris[1-phenyl-1H-benzimidazole] in the pentacene active layer
Yu, X., Yu, J., Zhou, J., Huang, W. & Lin, H., May 2013, In: EPJ Applied Physics. 62, 2, 20101.Research output: Journal Publications and Reviews › RGC 21 - Publication in refereed journal › peer-review
Scopus citations: 4- 1998
Observation of the elastic field related to a structural domain boundary along a {111}NiSi 2//{115}Si heterotwin interface
Bonnet, R., Loubradou, M. & Chen, F. R., May 1998, In: EPJ Applied Physics. 2, 2, p. 157-161Research output: Journal Publications and Reviews › RGC 21 - Publication in refereed journal › peer-review
Scopus citations: 7