Electrochemical Society Extended Abstracts

Electrochemical Society Extended Abstracts

ISSNs: 0160-4619

Journal

Journal Metrics
1 - 7 out of 7Page size: 20

Research Output

  1. 1993

  2. MEASUREMENT OF BORON CONTAMINATION IN N+ SILICON SUBSTRATES BY SECONDARY ION MASS SPECTROMETRY

    Chu, P. K., Bleiler, R. J., Metz, J. M., Hitzman, C. J. & Hockett, R. S., May 1993, In: Electrochemical Society Extended Abstracts. 93-1

    Research output: Journal Publications and Reviews › RGC 21 - Publication in refereed journal › peer-review

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  3. 1985

  4. ELECTROCHEMICAL STUDIES OF FUSED-THIOPHENE SYSTEMS.

    Jow, T. R., Jen, K. A., Elsenbaumer, R. L., Shacklette, L. W., Angelopoulos, M. & Cava, M. P., 1985, In: Electrochemical Society Extended Abstracts. 85-1, p. 102-103

    Research output: Journal Publications and Reviews › RGC 21 - Publication in refereed journal › peer-review

    Scopus citations: 1
    Check@CityULib
  5. 1984

  6. SURFACE CONTAMINATION INDUCED BY REACTIVE ION ETCHING IN CF//4 AND CHF//3.

    Pang, S. W., Mountain, R. W. & Rathman, D. D., 1984, In: Electrochemical Society Extended Abstracts. 84-1, p. 129-130

    Research output: Journal Publications and Reviews › RGC 21 - Publication in refereed journal › peer-review

    Scopus citations: 1
    Check@CityULib
  7. 1983

  8. EFFECT OF CHAMBER CONFIGURATION AND BIAS VOLTAGE ON DAMAGE INDUCED IN Si BY REACTION ION ETCHING.

    Pang, S. W., Horwitz, C. M., Rathman, D. D., Cabral, S. M., Silversmith, D. J. & Mountain, R. W., 1983, In: Electrochemical Society Extended Abstracts. 83-1, p. 278-279

    Research output: Journal Publications and Reviews › RGC 21 - Publication in refereed journal › peer-review

    Scopus citations: 1
    Check@CityULib

  9. PREPARATION OF DUCTILE NICKEL ALUMINIDES FOR HIGH-TEMPERATURE USES.

    Liu, C. T., Koch, C. C. & White, C. L., 1983, In: Electrochemical Society Extended Abstracts. 83-1, p. 687-688

    Research output: Journal Publications and Reviews › RGC 21 - Publication in refereed journal › peer-review

    Scopus citations: 1
    Check@CityULib
  10. 1982

  11. INFLUENCE OF SILICIDE FORMATION OF SHALLOW p-n JUNCTION CHARACTERISTICS.

    Ting, C. Y., Wittmer, M. & Tu, K. N., 1982, In: Electrochemical Society Extended Abstracts. 82-2, p. 257-258

    Research output: Journal Publications and Reviews › RGC 21 - Publication in refereed journal › peer-review

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  12. Si DAMAGE INDUCED BY DRY ETCHING.

    Pang, S., Rathman, D. D., Silversmith, D. J., Mountain, R. W. & DeGraff, P. D., 1982, In: Electrochemical Society Extended Abstracts. 82-2, p. 289-290

    Research output: Journal Publications and Reviews › RGC 21 - Publication in refereed journal › peer-review

    Scopus citations: 1
    Check@CityULib