Applied Physics Letters

Applied Physics Letters

ISSNs: 0003-6951

Additional searchable ISSN (Electronic): 1077-3118

AMER INST PHYSICS, United States

Scopus rating (2021): CiteScore 6.6 SJR 1.025 SNIP 1.119

Journal

Journal Metrics

Research Output

  1. 1989
  2. Study of planarization of cobalt silicide lines and silicon surfaces by scanning force microscopy and scanning electron microscopy

    Robrock, K. H., Tu, K. N., Abraham, D. W. & Clabes, J. B., 1989, In: Applied Physics Letters. 54, 16, p. 1543-1545

    Research output: Journal Publications and Reviews (RGC: 21, 22, 62)21_Publication in refereed journalpeer-review

    Scopus citations: 5
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  3. Thermogravimetric study of the recovery of oxygen-deficient superconducting YBa2Cu3O7-δ oxides in ambient oxygen

    Shi, L. T. & Tu, K. N., 1989, In: Applied Physics Letters. 55, 13, p. 1351-1353

    Research output: Journal Publications and Reviews (RGC: 21, 22, 62)21_Publication in refereed journalpeer-review

    Scopus citations: 21
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  4. 1988
  5. Separate paramagnetism and superconductivity in YBa2Cu3Oz

    Tang, H. B., Ren, Y., Liu, Y. L., Yan, Q. W. & Shao, X. Y., 12 Sep 1988, In: Applied Physics Letters. 53, 11, p. 1007-1009

    Research output: Journal Publications and Reviews (RGC: 21, 22, 62)21_Publication in refereed journalpeer-review

    Scopus citations: 1
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  6. Gettering of gold and copper with implanted carbon in silicon

    Wong, H., Cheung, N. W. & Chu, P. K., 1988, In: Applied Physics Letters. 52, 11, p. 889-891

    Research output: Journal Publications and Reviews (RGC: 21, 22, 62)21_Publication in refereed journalpeer-review

    Scopus citations: 82
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  7. Interaction of a polycrystalline silicon/SiO2/silicon substrate under thermal/electrical fields

    Chou, T. C. & Tu, K. N., 1988, In: Applied Physics Letters. 52, 16, p. 1317-1319

    Research output: Journal Publications and Reviews (RGC: 21, 22, 62)21_Publication in refereed journalpeer-review

    Scopus citations: 4
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  8. Low-temperature amorphous-to-crystalline transformation of CoSi2 films

    Cros, A., Tu, K. N., Smith, D. A. & Weiss, B. Z., 1988, In: Applied Physics Letters. 52, 16, p. 1311-1313

    Research output: Journal Publications and Reviews (RGC: 21, 22, 62)21_Publication in refereed journalpeer-review

    Scopus citations: 23
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  9. Proximity gettering with mega-electron-volt carbon and oxygen implantations

    Wong, H., Cheung, N. W., Chu, P. K., Liu, J. & Mayer, J. W., 1988, In: Applied Physics Letters. 52, 12, p. 1023-1025

    Research output: Journal Publications and Reviews (RGC: 21, 22, 62)21_Publication in refereed journalpeer-review

    Scopus citations: 144
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  10. Reaction kinetics of nickel/silicon multilayer films

    Clevenger, L. A., Thompson, C. V., Cammarata, R. C. & Tu, K. N., 1988, In: Applied Physics Letters. 52, 10, p. 795-797

    Research output: Journal Publications and Reviews (RGC: 21, 22, 62)21_Publication in refereed journalpeer-review

    Scopus citations: 101
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  11. 1987
  12. Diffusion of oxygen in superconducting YBa2Cu3O7-δ oxide upon annealing in helium and oxygen ambients

    Tu, K. N., Park, S. I. & Tsuei, C. C., 21 Dec 1987, In: Applied Physics Letters. 51, 25, p. 2158-2160

    Research output: Journal Publications and Reviews (RGC: 21, 22, 62)21_Publication in refereed journalpeer-review

    Scopus citations: 64
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  13. Effects of interface reactions on electrical characteristics of metal-GaAs contacts

    Yu, K. M., Walukiewicz, W., Jaklevic, J. M., Haller, E. E. & Sands, T., 20 Jul 1987, In: Applied Physics Letters. 51, 3, p. 189-191

    Research output: Journal Publications and Reviews (RGC: 21, 22, 62)21_Publication in refereed journalpeer-review

    Scopus citations: 23
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  14. Formation of submicron epitaxial islands of Pd2Si on silicon

    Boothroyd, C. B., Stobbs, W. M. & Tu, K. N., 1987, In: Applied Physics Letters. 50, 10, p. 577-579

    Research output: Journal Publications and Reviews (RGC: 21, 22, 62)21_Publication in refereed journalpeer-review

    Scopus citations: 5
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  15. Nanometer-scale columns in GaAs fabricated by angled chlorine ion-beam-assisted etching

    Goodhue, W. D., Pang, S. W., Johnson, G. D., Astolfi, D. K. & Ehrlich, D. J., 1987, In: Applied Physics Letters. 51, 21, p. 1726-1728

    Research output: Journal Publications and Reviews (RGC: 21, 22, 62)21_Publication in refereed journalpeer-review

    Scopus citations: 8
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  16. NiSi2 precipitation in nickel-implanted silicon films

    Cammarata, R. C., Thompson, C. V. & Tu, K. N., 1987, In: Applied Physics Letters. 51, 14, p. 1106-1108

    Research output: Journal Publications and Reviews (RGC: 21, 22, 62)21_Publication in refereed journalpeer-review

    Scopus citations: 23
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  17. 1986
  18. Influence of sputtering damage on chemical interactions at Cr-SiO2 interfaces

    Cros, A., Schrott, A. G., Thompson, R. D. & Tu, K. N., 2 Jun 1986, In: Applied Physics Letters. 48, 22, p. 1547-1549

    Research output: Journal Publications and Reviews (RGC: 21, 22, 62)21_Publication in refereed journalpeer-review

    Scopus citations: 3
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  19. Enhanced grain growth of phosphorus-doped polycrystalline silicon by titanium silicide formation

    Chou, T. C., Wong, C. Y. & Tu, K. N., 1986, In: Applied Physics Letters. 49, 20, p. 1381-1383

    Research output: Journal Publications and Reviews (RGC: 21, 22, 62)21_Publication in refereed journalpeer-review

    Scopus citations: 15
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  20. Transmission electron microscopic observations of amorphous NiZr alloy formation by solid-state reaction

    Newcomb, S. B. & Tu, K. N., 1986, In: Applied Physics Letters. 48, 21, p. 1436-1438

    Research output: Journal Publications and Reviews (RGC: 21, 22, 62)21_Publication in refereed journalpeer-review

    Scopus citations: 96
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  21. 1985
  22. Effect of dopant on reaction between polycrystalline silicon and thin-film rhodium

    Psaras, P. A., Thompson, R. D. & Tu, K. N., 1985, In: Applied Physics Letters. 47, 3, p. 250-252

    Research output: Journal Publications and Reviews (RGC: 21, 22, 62)21_Publication in refereed journalpeer-review

    Scopus citations: 6
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  23. Tungsten-platinum alloy Schottky barriers on n-type GaAs

    Okumura, T. & Tu, K. N., 1985, In: Applied Physics Letters. 47, 1, p. 42-44

    Research output: Journal Publications and Reviews (RGC: 21, 22, 62)21_Publication in refereed journalpeer-review

    Scopus citations: 2
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  24. 1984
  25. Two-step Al/Ti metallization to PtSi/Si structures

    Eizenberg, M., Tu, K. N., Palmstrøm, C. J. & Mayer, J. W., 1984, In: Applied Physics Letters. 45, 8, p. 905-907

    Research output: Journal Publications and Reviews (RGC: 21, 22, 62)21_Publication in refereed journalpeer-review

    Scopus citations: 2
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  26. 1983
  27. Formation of an amorphous Rh-Si alloy by interfacial reaction between amorphous Si and crystalline Rh thin films

    Herd, S., Tu, K. N. & Ahn, K. Y., 1 Apr 1983, In: Applied Physics Letters. 42, 7, p. 597-599

    Research output: Journal Publications and Reviews (RGC: 21, 22, 62)21_Publication in refereed journalpeer-review

    Scopus citations: 100
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