Applied Physics Letters

Applied Physics Letters

ISSNs: 0003-6951

Additional searchable ISSN (Electronic): 1077-3118

AMER INST PHYSICS, United States

Scopus rating (2021): CiteScore 6.6 SJR 1.025 SNIP 1.119

Journal

Journal Metrics

Research Output

  1. 1998
  2. Cracking behavior of xerogel silica films on silicon substrates

    Chow, L. A., Xu, Y. H., Dunn, B., Tu, K. N. & Chiang, C., 1998, In: Applied Physics Letters. 73, 20, p. 2944-2946

    Research output: Journal Publications and Reviews (RGC: 21, 22, 62)21_Publication in refereed journalpeer-review

    Scopus citations: 21
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  3. Electronic properties of GaAs surfaces etched in an electron cyclotron resonance source and chemically passivated using P2S5

    Glembocki, O. J., Tuchman, J. A., Dagata, J. A., Ko, K. K., Pang, S. W. & Stutz, C. E., 1998, In: Applied Physics Letters. 73, 1, p. 114-116

    Research output: Journal Publications and Reviews (RGC: 21, 22, 62)21_Publication in refereed journalpeer-review

    Scopus citations: 7
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  4. Tapping-mode tuning fork force sensing for near-field scanning optical microscopy

    Tsai, D. P. & Lu, Y. Y., 1998, In: Applied Physics Letters. 73, 19, p. 2724-2726

    Research output: Journal Publications and Reviews (RGC: 21, 22, 62)21_Publication in refereed journalpeer-review

    Scopus citations: 73
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  5. Zinc and phosphorus co-implantation in indium phosphide

    Yu, K. M. & Ridgway, M. C., 1998, In: Applied Physics Letters. 73, 1, p. 52-54

    Research output: Journal Publications and Reviews (RGC: 21, 22, 62)21_Publication in refereed journalpeer-review

    Scopus citations: 8
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  6. 1997
  7. Microstructures of phased-in Cr-Cu/Cu/Au bump-limiting metallization and its soldering behavior with high Pb content and eutectic PbSn solders

    Pan, G. Z., Liu, A. A., Kim, H. K., Tu, K. N. & Totta, P. A., 17 Nov 1997, In: Applied Physics Letters. 71, 20, p. 2946-2948

    Research output: Journal Publications and Reviews (RGC: 21, 22, 62)21_Publication in refereed journalpeer-review

    Scopus citations: 49
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  8. Direct observation of the amphoteric behavior of Ge in InP modified by P co-implantation

    Yu, K. M. & Ridgway, M. C., 18 Aug 1997, In: Applied Physics Letters. 71, 7, p. 939-941

    Research output: Journal Publications and Reviews (RGC: 21, 22, 62)21_Publication in refereed journalpeer-review

    Scopus citations: 6
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  9. Microstructural evolution of {113} rodlike defects and {111} dislocation loops in silicon-implanted silicon

    Pan, G. Z., Tu, K. N. & Prussin, S., 4 Aug 1997, In: Applied Physics Letters. 71, 5, p. 659-661

    Research output: Journal Publications and Reviews (RGC: 21, 22, 62)21_Publication in refereed journalpeer-review

    Scopus citations: 15
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  10. Fracture toughness and fatigue-crack propagation in a Zr-Ti-Ni-Cu-Be bulk metallic glass

    Gilbert, C. J., Ritchie, R. O. & Johnson, W. L., 28 Jul 1997, In: Applied Physics Letters. 71, 4, p. 476-478

    Research output: Journal Publications and Reviews (RGC: 21, 22, 62)21_Publication in refereed journalpeer-review

    Scopus citations: 440
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  11. Soldering reaction between eutectic SnPb and plated Pd/Ni thin films on Cu leadframe

    Kim, P. G., Tu, K. N. & Abbott, D. C., 7 Jul 1997, In: Applied Physics Letters. 71, 1, p. 61-63

    Research output: Journal Publications and Reviews (RGC: 21, 22, 62)21_Publication in refereed journalpeer-review

    Scopus citations: 12
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  12. Synthesis of GaN nanocrystals by sequential ion implantation

    Wolk, J. A., Yu, K. M., Bourret-Courchesne, E. D. & Johnson, E., 28 Apr 1997, In: Applied Physics Letters. 70, 17, p. 2268-2270

    Research output: Journal Publications and Reviews (RGC: 21, 22, 62)21_Publication in refereed journalpeer-review

    Scopus citations: 33
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  13. 1996
  14. Dewetting of molten Sn on Au/Cu/Cr thin-film metallization

    Liu, C. Y., Kim, H. K., Tu, K. N. & Totta, P. A., 23 Dec 1996, In: Applied Physics Letters. 69, 26, p. 4014-4016

    Research output: Journal Publications and Reviews (RGC: 21, 22, 62)21_Publication in refereed journalpeer-review

    Scopus citations: 46
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  15. The mechanism of texture formation during film growth: The roles of preferential sputtering and shadowing

    Ying, F., Smith, R. W. & Srolovitz, D. J., 11 Nov 1996, In: Applied Physics Letters. 69, 20, p. 3007-3009

    Research output: Journal Publications and Reviews (RGC: 21, 22, 62)21_Publication in refereed journalpeer-review

    Scopus citations: 52
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  16. Anomalous ion damage behavior in ZnSe

    Yu, K. M. & Bourret-Courchesne, E. D., 30 Sep 1996, In: Applied Physics Letters. 69, 14, p. 2062-2064

    Research output: Journal Publications and Reviews (RGC: 21, 22, 62)21_Publication in refereed journalpeer-review

    Scopus citations: 12
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  17. Structural modeling of the possible growth of oriented textured single-crystal diamond film on a silicon (111) surface

    Zhang, R. Q., Wang, W. L., Esteve, J. & Bertran, E., 19 Aug 1996, In: Applied Physics Letters. 69, 8, p. 1086-1088

    Research output: Journal Publications and Reviews (RGC: 21, 22, 62)21_Publication in refereed journalpeer-review

    Scopus citations: 15
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  18. Local structural modification in ion damaged InGaAs

    Yu, K. M. & Hsu, L., 5 Aug 1996, In: Applied Physics Letters. 69, 6, p. 824-826

    Research output: Journal Publications and Reviews (RGC: 21, 22, 62)21_Publication in refereed journalpeer-review

    Scopus citations: 6
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  19. Ripening-assisted asymmetric spalling of Cu-Sn compound spheroids in solder joints on Si wafers

    Kim, H. K., Tu, K. N. & Totta, P. A., 15 Apr 1996, In: Applied Physics Letters. 68, 16, p. 2204-2206

    Research output: Journal Publications and Reviews (RGC: 21, 22, 62)21_Publication in refereed journalpeer-review

    Scopus citations: 97
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  20. Diamond film orientation by ion bombardment during deposition

    Jiang, X., Zhang, W. J., Paul, M. & Klages, C., 1 Apr 1996, In: Applied Physics Letters. 68, 14, p. 1927-1929

    Research output: Journal Publications and Reviews (RGC: 21, 22, 62)21_Publication in refereed journalpeer-review

    Scopus citations: 69
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  21. Size distribution of end-of-range dislocation loops in silicon-implanted silicon

    Pan, G. Z., Tu, K. N. & Prussin, S., 18 Mar 1996, In: Applied Physics Letters. 68, 12, p. 1654-1656

    Research output: Journal Publications and Reviews (RGC: 21, 22, 62)21_Publication in refereed journalpeer-review

    Scopus citations: 17
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  22. 1995
  23. Improved corrosion resistance of cation substituted YBa2Cu3O7-δ

    Zhou, J., Savoy, S. M., Lo, R., Zhao, J., Arendt, M., Zhu, Y. T., Manthiram, A. & 1 others, McDevitt, J. T., 22 May 1995, In: Applied Physics Letters. 66, 21, p. 2900-2902

    Research output: Journal Publications and Reviews (RGC: 21, 22, 62)21_Publication in refereed journalpeer-review

    Scopus citations: 27
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  24. Effects of electron cyclotron resonance etching on the ambient (100) GaAs surface

    Glembocki, O. J., Tuchman, J. A., Ko, K. K., Pang, S. W., Giordana, A., Kaplan, R. & Stutz, C. E., 1995, In: Applied Physics Letters. 66

    Research output: Journal Publications and Reviews (RGC: 21, 22, 62)21_Publication in refereed journalpeer-review

    Scopus citations: 11
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