Supporting data for "Incremental Model-based Test Suite Reduction with Formal Concept Analysis"
Dataset
Researcher(s)
- Pin Ng (Creator)
- Ying Kit Richard FUNG (Creator)
- Wai Man KONG (Creator)
Research Unit(s)
External organisation(s)
- Hong Kong Polytechnic University
- AML Holdings Limited
Description
Test scenarios can be derived based on some system models for requirements validation purposes. Model-based test suite reduction aims to provide a smaller set of test scenarios which can preserve the original test coverage with respect to some testing criteria. We are proposing to apply Formal Concept Analysis (FCA) in analyzing the association between a set of test scenarios and a set of transitions specified in a state machine model. By utilizing the properties of concept lattice, we are able to determine incrementally a minimal set of test scenarios with adequate test coverage. ⓒ 2010 KIPS
Date made available | 30 Jun 2010 |
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Publisher | Journal of Information Processing Systems |
Date of data production | Jun 2010 |
Link(s)
Attachment(s) | DocumentsFig6_Test_scenarios_of_the_state_machine_model.png Image, 62.6 KB, image/png Algorithm_incremental_selection_of_test_scenarios.rtf Model, 235 KB, application/x-rtf Fig5_State_machine_model_of_an_ATM_system.png Workflow, 157 KB, image/png |
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